Ultrahigh coercivity magnetic force microscopy probes to analyze high-moment magnetic structures and devices

Nissim Amos, Robert Fernandez, Rabee M. Ikkawi, Meir Shachar, Jeongmin Hong, Beomseop Lee, Dmtri Litvinov, Sakhrat Khizroev

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

This letter addresses the fabrication and exploitation of ultrahigh coercivity magnetic force microscopy (MFM) probes to characterize high-magnetic moment nanostructures and devices. The L10 phase of FePt alloys together with CrRu and MgO seed layers are investigated as a method of increasing the coercivity of MFM probes to prevent their behavior as soft magnetic probes when used to image energized magnetic devices. The newly developed MFM probes, with coercivity higher than 11 kOe, are utilized to successfully analyze a modern perpendicular magnetic recording write head under various excitation conditions in order to perform writer saturation and remanence tests. The results include MFM micrographs of a fully energized magnetic writer, obtained with a probe-sample separation of only 10 nm.

Original languageEnglish (US)
Article number5497046
JournalIEEE Magnetics Letters
Volume1
DOIs
StatePublished - 2010
Externally publishedYes

Keywords

  • hard magnetic materials
  • information storage
  • magnetic force microscopy (MFM)
  • Magnetic instruments
  • magnetic recording transducers

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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