Trap-clearing Spectroscopy in Perylene Diimide Derivatives

Louisa M. Smieska, Zhong Li, David Ley, Adam Braunschweig, John A. Marohn

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Perylene diimide (PDI) derivatives are important components of organic circuits and photovoltaic systems, but the electron trapping mechanism(s) in higher-LUMO PDIs (-3 to -4 eV, where radical anions are expected to react with atmospheric water and oxygen) are not well characterized. Here, we examine the spatial distribution of traps in transistors made from PDIs with these higher LUMO levels and measure trap-clearing spectra in n-type organic materials using time- and wavelength-resolved frequency-modulated Kelvin probe force microscopy (FM-KPFM). We find that the rate of trap-clearing under visible light does not follow a LUMO-level trend, and we observe spectral evidence for different trapping mechanisms on bare versus HMDS-treated SiO2.

Original languageEnglish (US)
Pages (from-to)813-820
Number of pages8
JournalChemistry of Materials
Volume28
Issue number3
DOIs
StatePublished - Feb 9 2016

Fingerprint

Perylene
Spatial distribution
Anions
Microscopic examination
Transistors
Negative ions
Spectroscopy
Oxygen
Derivatives
Wavelength
Electrons
Water
Networks (circuits)

ASJC Scopus subject areas

  • Materials Chemistry
  • Chemical Engineering(all)
  • Chemistry(all)

Cite this

Smieska, L. M., Li, Z., Ley, D., Braunschweig, A., & Marohn, J. A. (2016). Trap-clearing Spectroscopy in Perylene Diimide Derivatives. Chemistry of Materials, 28(3), 813-820. https://doi.org/10.1021/acs.chemmater.5b04025

Trap-clearing Spectroscopy in Perylene Diimide Derivatives. / Smieska, Louisa M.; Li, Zhong; Ley, David; Braunschweig, Adam; Marohn, John A.

In: Chemistry of Materials, Vol. 28, No. 3, 09.02.2016, p. 813-820.

Research output: Contribution to journalArticle

Smieska, LM, Li, Z, Ley, D, Braunschweig, A & Marohn, JA 2016, 'Trap-clearing Spectroscopy in Perylene Diimide Derivatives', Chemistry of Materials, vol. 28, no. 3, pp. 813-820. https://doi.org/10.1021/acs.chemmater.5b04025
Smieska, Louisa M. ; Li, Zhong ; Ley, David ; Braunschweig, Adam ; Marohn, John A. / Trap-clearing Spectroscopy in Perylene Diimide Derivatives. In: Chemistry of Materials. 2016 ; Vol. 28, No. 3. pp. 813-820.
@article{32ed7f25b35e45a9ba1d31b70940c848,
title = "Trap-clearing Spectroscopy in Perylene Diimide Derivatives",
abstract = "Perylene diimide (PDI) derivatives are important components of organic circuits and photovoltaic systems, but the electron trapping mechanism(s) in higher-LUMO PDIs (-3 to -4 eV, where radical anions are expected to react with atmospheric water and oxygen) are not well characterized. Here, we examine the spatial distribution of traps in transistors made from PDIs with these higher LUMO levels and measure trap-clearing spectra in n-type organic materials using time- and wavelength-resolved frequency-modulated Kelvin probe force microscopy (FM-KPFM). We find that the rate of trap-clearing under visible light does not follow a LUMO-level trend, and we observe spectral evidence for different trapping mechanisms on bare versus HMDS-treated SiO2.",
author = "Smieska, {Louisa M.} and Zhong Li and David Ley and Adam Braunschweig and Marohn, {John A.}",
year = "2016",
month = "2",
day = "9",
doi = "10.1021/acs.chemmater.5b04025",
language = "English (US)",
volume = "28",
pages = "813--820",
journal = "Chemistry of Materials",
issn = "0897-4756",
publisher = "American Chemical Society",
number = "3",

}

TY - JOUR

T1 - Trap-clearing Spectroscopy in Perylene Diimide Derivatives

AU - Smieska, Louisa M.

AU - Li, Zhong

AU - Ley, David

AU - Braunschweig, Adam

AU - Marohn, John A.

PY - 2016/2/9

Y1 - 2016/2/9

N2 - Perylene diimide (PDI) derivatives are important components of organic circuits and photovoltaic systems, but the electron trapping mechanism(s) in higher-LUMO PDIs (-3 to -4 eV, where radical anions are expected to react with atmospheric water and oxygen) are not well characterized. Here, we examine the spatial distribution of traps in transistors made from PDIs with these higher LUMO levels and measure trap-clearing spectra in n-type organic materials using time- and wavelength-resolved frequency-modulated Kelvin probe force microscopy (FM-KPFM). We find that the rate of trap-clearing under visible light does not follow a LUMO-level trend, and we observe spectral evidence for different trapping mechanisms on bare versus HMDS-treated SiO2.

AB - Perylene diimide (PDI) derivatives are important components of organic circuits and photovoltaic systems, but the electron trapping mechanism(s) in higher-LUMO PDIs (-3 to -4 eV, where radical anions are expected to react with atmospheric water and oxygen) are not well characterized. Here, we examine the spatial distribution of traps in transistors made from PDIs with these higher LUMO levels and measure trap-clearing spectra in n-type organic materials using time- and wavelength-resolved frequency-modulated Kelvin probe force microscopy (FM-KPFM). We find that the rate of trap-clearing under visible light does not follow a LUMO-level trend, and we observe spectral evidence for different trapping mechanisms on bare versus HMDS-treated SiO2.

UR - http://www.scopus.com/inward/record.url?scp=84957991091&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84957991091&partnerID=8YFLogxK

U2 - 10.1021/acs.chemmater.5b04025

DO - 10.1021/acs.chemmater.5b04025

M3 - Article

VL - 28

SP - 813

EP - 820

JO - Chemistry of Materials

JF - Chemistry of Materials

SN - 0897-4756

IS - 3

ER -