Trap-clearing Spectroscopy in Perylene Diimide Derivatives

Louisa M. Smieska; Zhong Li; David Ley; Adam B. Braunschweig; John A. Marohn

doi:10.1021/acs.chemmater.5b04025

Trap-clearing Spectroscopy in Perylene Diimide Derivatives

Louisa M. Smieska, Zhong Li, David Ley, Adam B. Braunschweig, John A. Marohn

Chemistry

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

Perylene diimide (PDI) derivatives are important components of organic circuits and photovoltaic systems, but the electron trapping mechanism(s) in higher-LUMO PDIs (-3 to -4 eV, where radical anions are expected to react with atmospheric water and oxygen) are not well characterized. Here, we examine the spatial distribution of traps in transistors made from PDIs with these higher LUMO levels and measure trap-clearing spectra in n-type organic materials using time- and wavelength-resolved frequency-modulated Kelvin probe force microscopy (FM-KPFM). We find that the rate of trap-clearing under visible light does not follow a LUMO-level trend, and we observe spectral evidence for different trapping mechanisms on bare versus HMDS-treated SiO₂.

Original language	English (US)
Pages (from-to)	813-820
Number of pages	8
Journal	Chemistry of Materials
Volume	28
Issue number	3
DOIs	https://doi.org/10.1021/acs.chemmater.5b04025
State	Published - Feb 9 2016

ASJC Scopus subject areas

Chemistry(all)
Chemical Engineering(all)
Materials Chemistry

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@article{32ed7f25b35e45a9ba1d31b70940c848,

title = "Trap-clearing Spectroscopy in Perylene Diimide Derivatives",

abstract = "Perylene diimide (PDI) derivatives are important components of organic circuits and photovoltaic systems, but the electron trapping mechanism(s) in higher-LUMO PDIs (-3 to -4 eV, where radical anions are expected to react with atmospheric water and oxygen) are not well characterized. Here, we examine the spatial distribution of traps in transistors made from PDIs with these higher LUMO levels and measure trap-clearing spectra in n-type organic materials using time- and wavelength-resolved frequency-modulated Kelvin probe force microscopy (FM-KPFM). We find that the rate of trap-clearing under visible light does not follow a LUMO-level trend, and we observe spectral evidence for different trapping mechanisms on bare versus HMDS-treated SiO2.",

author = "Smieska, {Louisa M.} and Zhong Li and David Ley and Braunschweig, {Adam B.} and Marohn, {John A.}",

note = "Funding Information: This work was supported by an NSF graduate research fellowship as well as funding from NSF-DMR 1006633, NSF-DMR 1309540, and the Army Research Office (W911NF-14-1-0164). This work made use of the Cornell Center for Materials Research Shared Facilities which are supported through the NSF MRSEC program (DMR-1120296). The authors thank Prof. William R. Dichtel for helpful discussions. We are grateful for the assistance of Dr. Chunhua Hu at the Department of Chemistry of New York University with X-ray analysis. We also thank Dr. Yu-Sheng Chen at Chemistry and Materials Science Sector of the Center for Advanced Radiation Sources (ChemMatCARS) at the Advanced Photon Source (APS), Sector 15, which is principally supported by the Divisions of Chemistry (CHE) and Materials Research (DMR), National Science Foundation (NSF), under grant number NSF/CHE-1346572. Use of the Advanced Photon Source, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science by Argonne National Laboratory, was supported by the U.S. DOE under Contract No. DE-AC02-06CH11357.",

year = "2016",

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doi = "10.1021/acs.chemmater.5b04025",

language = "English (US)",

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T1 - Trap-clearing Spectroscopy in Perylene Diimide Derivatives

AU - Smieska, Louisa M.

AU - Li, Zhong

AU - Ley, David

AU - Braunschweig, Adam B.

AU - Marohn, John A.

N1 - Funding Information: This work was supported by an NSF graduate research fellowship as well as funding from NSF-DMR 1006633, NSF-DMR 1309540, and the Army Research Office (W911NF-14-1-0164). This work made use of the Cornell Center for Materials Research Shared Facilities which are supported through the NSF MRSEC program (DMR-1120296). The authors thank Prof. William R. Dichtel for helpful discussions. We are grateful for the assistance of Dr. Chunhua Hu at the Department of Chemistry of New York University with X-ray analysis. We also thank Dr. Yu-Sheng Chen at Chemistry and Materials Science Sector of the Center for Advanced Radiation Sources (ChemMatCARS) at the Advanced Photon Source (APS), Sector 15, which is principally supported by the Divisions of Chemistry (CHE) and Materials Research (DMR), National Science Foundation (NSF), under grant number NSF/CHE-1346572. Use of the Advanced Photon Source, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science by Argonne National Laboratory, was supported by the U.S. DOE under Contract No. DE-AC02-06CH11357.

PY - 2016/2/9

Y1 - 2016/2/9

N2 - Perylene diimide (PDI) derivatives are important components of organic circuits and photovoltaic systems, but the electron trapping mechanism(s) in higher-LUMO PDIs (-3 to -4 eV, where radical anions are expected to react with atmospheric water and oxygen) are not well characterized. Here, we examine the spatial distribution of traps in transistors made from PDIs with these higher LUMO levels and measure trap-clearing spectra in n-type organic materials using time- and wavelength-resolved frequency-modulated Kelvin probe force microscopy (FM-KPFM). We find that the rate of trap-clearing under visible light does not follow a LUMO-level trend, and we observe spectral evidence for different trapping mechanisms on bare versus HMDS-treated SiO2.

AB - Perylene diimide (PDI) derivatives are important components of organic circuits and photovoltaic systems, but the electron trapping mechanism(s) in higher-LUMO PDIs (-3 to -4 eV, where radical anions are expected to react with atmospheric water and oxygen) are not well characterized. Here, we examine the spatial distribution of traps in transistors made from PDIs with these higher LUMO levels and measure trap-clearing spectra in n-type organic materials using time- and wavelength-resolved frequency-modulated Kelvin probe force microscopy (FM-KPFM). We find that the rate of trap-clearing under visible light does not follow a LUMO-level trend, and we observe spectral evidence for different trapping mechanisms on bare versus HMDS-treated SiO2.

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