Tin whisker electrical short circuit characteristics - Part I

Karim J. Courey, Shihab S Asfour, Jon A. Bayliss, Lawrence L. Ludwig, Maria C. Zapata

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that has a currently unknown probability associated with it. Due to contact resistance, electrical shorts may not occur at lower voltage levels. In this experiment, we study the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From this data, we can estimate the probability of an electrical short, as a function of voltage, given that a free tin whisker has bridged two adjacent exposed electrical conductors. In addition, three tin whiskers grown from the same Space Shuttle Orbiter card guide used in the aforementioned experiment were cross sectioned and studied using a focused ion beam (FIB).

Original languageEnglish
Pages (from-to)32-40
Number of pages9
JournalIEEE Transactions on Electronics Packaging Manufacturing
Volume31
Issue number1
DOIs
StatePublished - Jan 1 2008

Fingerprint

Short circuit currents
Tin
Contact resistance
Electric potential
Focused ion beams
Space shuttles
Experiments

Keywords

  • Contact resistance
  • Focused ion beam (FIB)
  • Short circuit
  • Tin whiskers

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering

Cite this

Tin whisker electrical short circuit characteristics - Part I. / Courey, Karim J.; Asfour, Shihab S; Bayliss, Jon A.; Ludwig, Lawrence L.; Zapata, Maria C.

In: IEEE Transactions on Electronics Packaging Manufacturing, Vol. 31, No. 1, 01.01.2008, p. 32-40.

Research output: Contribution to journalArticle

Courey, Karim J. ; Asfour, Shihab S ; Bayliss, Jon A. ; Ludwig, Lawrence L. ; Zapata, Maria C. / Tin whisker electrical short circuit characteristics - Part I. In: IEEE Transactions on Electronics Packaging Manufacturing. 2008 ; Vol. 31, No. 1. pp. 32-40.
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