The effects of edge defects on the switching characteristics of bit patterned media

E. Chunsheng, Vishal Parekh, James O. Rantschler, Paul Ruchhoeft, Sakhrat Khizroev, Dmitri Litvinov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present the results of micromagnetic studies on realistic patterning defects in perpendicularly oriented magnetic thin films. Both undercut and line edge roughness are investigated systematically with simulations using simple test structures to see the effect of the side wall angle, the roughness amplitude on a nanostructure's switching field, and the roughness period on mathematically tractable figures. We then run simulations of hysteresis loops of actual 200 nm diameter nanostructures using AFM images to define the structure boundary and compare the results to MFM images of DC demagnetized dots.

Original languageEnglish (US)
Title of host publication2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings
PublisherIEEE Computer Society
Pages339-340
Number of pages2
ISBN (Print)1424406080, 9781424406081
DOIs
StatePublished - 2007
Externally publishedYes
Event2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007 - Hong Kong, China
Duration: Aug 2 2007Aug 5 2007

Publication series

Name2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings

Other

Other2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007
Country/TerritoryChina
CityHong Kong
Period8/2/078/5/07

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Fingerprint

Dive into the research topics of 'The effects of edge defects on the switching characteristics of bit patterned media'. Together they form a unique fingerprint.

Cite this