Temperature dependent structural and thermoelectric properties of Cs8Na16Si136 and Cs8Na16Ge136

G. S. Nolas, D. G. VanDerveer, A. P. Wilkinson, J. L. Cohn

Research output: Contribution to conferencePaper

Abstract

The temperature dependence of the atomic displacement parameters (ADPs) determined from single crystal x-ray diffraction data for Cs8Na16Si136 and Cs8Na16Ge136 as well as the thermoelectric properties of polycrystalline specimens is reported. Anomalously large values of the ADPs for the alkali-metal atoms are revealed. These data indicate that a large amount of dynamic disorder is associated with the "rattling" alkali-metal atoms inside the two different polyhedra that makeup the clathrate framework. Transport measurements show that these compounds are metallic conductors. The potential of type II clathrate materials for thermoelectric applications is also discussed.

Original languageEnglish (US)
Pages254-257
Number of pages4
StatePublished - Dec 1 2001
Externally publishedYes
Event20th International Conference on Thermoelectrics ICT'01 - Beijing, China
Duration: Jun 8 2001Jun 11 2001

Other

Other20th International Conference on Thermoelectrics ICT'01
CountryChina
CityBeijing
Period6/8/016/11/01

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Nolas, G. S., VanDerveer, D. G., Wilkinson, A. P., & Cohn, J. L. (2001). Temperature dependent structural and thermoelectric properties of Cs8Na16Si136 and Cs8Na16Ge136. 254-257. Paper presented at 20th International Conference on Thermoelectrics ICT'01, Beijing, China.