Abstract
Surface effects are important to predict the mechanical behavior of nanostructures. In this paper, the wrinkling of a stiff thin film bonded to a compliant substrate is studied using an energy method accounting for surface elasticity and residual surface tension. The wavelength, critical buckling strain and amplitude are obtained analytically. These results provide valuable guide to the precise design and control of the wrinkling profile in many applications ranging from stretchable electronics to micro/nano scale surface patterning and precision metrology.
| Original language | English |
|---|---|
| Pages (from-to) | 2077-2079 |
| Number of pages | 3 |
| Journal | Thin Solid Films |
| Volume | 520 |
| Issue number | 6 |
| DOIs | |
| State | Published - Jan 1 2012 |
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Keywords
- Surface effect
- Thin films
- Wrinkles
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Metals and Alloys
- Surfaces, Coatings and Films
- Surfaces and Interfaces
Cite this
Surface effects on the wrinkles in a stiff thin film bonded to a compliant substrate. / Li, Yuhang; Fang, Bo; Zhang, Jiazhong; Song, Jizhou.
In: Thin Solid Films, Vol. 520, No. 6, 01.01.2012, p. 2077-2079.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Surface effects on the wrinkles in a stiff thin film bonded to a compliant substrate
AU - Li, Yuhang
AU - Fang, Bo
AU - Zhang, Jiazhong
AU - Song, Jizhou
PY - 2012/1/1
Y1 - 2012/1/1
N2 - Surface effects are important to predict the mechanical behavior of nanostructures. In this paper, the wrinkling of a stiff thin film bonded to a compliant substrate is studied using an energy method accounting for surface elasticity and residual surface tension. The wavelength, critical buckling strain and amplitude are obtained analytically. These results provide valuable guide to the precise design and control of the wrinkling profile in many applications ranging from stretchable electronics to micro/nano scale surface patterning and precision metrology.
AB - Surface effects are important to predict the mechanical behavior of nanostructures. In this paper, the wrinkling of a stiff thin film bonded to a compliant substrate is studied using an energy method accounting for surface elasticity and residual surface tension. The wavelength, critical buckling strain and amplitude are obtained analytically. These results provide valuable guide to the precise design and control of the wrinkling profile in many applications ranging from stretchable electronics to micro/nano scale surface patterning and precision metrology.
KW - Surface effect
KW - Thin films
KW - Wrinkles
UR - http://www.scopus.com/inward/record.url?scp=84855979552&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84855979552&partnerID=8YFLogxK
U2 - 10.1016/j.tsf.2011.11.085
DO - 10.1016/j.tsf.2011.11.085
M3 - Article
AN - SCOPUS:84855979552
VL - 520
SP - 2077
EP - 2079
JO - Thin Solid Films
JF - Thin Solid Films
SN - 0040-6090
IS - 6
ER -