Submerged reflectance measurements as a function of visible wavelength

John W. Giles, Kenneth J. Voss

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations


Submerged spectral reflectance measurements made on paint samples using two different techniques are compared. With the first technique spectral measurements are made with a simple thin water film measurement technique originally used for photopic viewing. A comparison of these measurements with a second technique in which the measured sample is immersed in water in a cylindrical container and the submerged reflectance is measured with a goniophotometer shows good agreement for wavelengths from 420 to 700 nm.

Original languageEnglish (US)
Pages (from-to)140-146
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - Dec 1 1991
EventUnderwater Imaging, Photography, and Visibility 1991 - San Diego, United States
Duration: Jul 21 1991 → …

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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