Submerged reflectance measurements as a function of visible wavelength

John W. Giles; Kenneth J. Voss

doi:10.1117/12.48878

Submerged reflectance measurements as a function of visible wavelength

John W. Giles, Kenneth J. Voss

Research output: Contribution to journal › Conference article

2 Scopus citations

Abstract

Submerged spectral reflectance measurements made on paint samples using two different techniques are compared. With the first technique spectral measurements are made with a simple thin water film measurement technique originally used for photopic viewing. A comparison of these measurements with a second technique in which the measured sample is immersed in water in a cylindrical container and the submerged reflectance is measured with a goniophotometer shows good agreement for wavelengths from 420 to 700 nm.

Original language	English (US)
Pages (from-to)	140-146
Number of pages	7
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1537
DOIs	https://doi.org/10.1117/12.48878
State	Published - Dec 1 1991
Externally published	Yes
Event	Underwater Imaging, Photography, and Visibility 1991 - San Diego, United States Duration: Jul 21 1991 → …

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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Giles, J. W., & Voss, K. J. (1991). Submerged reflectance measurements as a function of visible wavelength. Proceedings of SPIE - The International Society for Optical Engineering, 1537, 140-146. https://doi.org/10.1117/12.48878

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