Submerged reflectance measurements as a function of visible wavelength

John W. Giles; Kenneth J. Voss

doi:10.1117/12.48878

Submerged reflectance measurements as a function of visible wavelength

John W. Giles, Kenneth J. Voss

Physics

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

Submerged spectral reflectance measurements made on paint samples using two different techniques are compared. With the first technique spectral measurements are made with a simple thin water film measurement technique originally used for photopic viewing. A comparison of these measurements with a second technique in which the measured sample is immersed in water in a cylindrical container and the submerged reflectance is measured with a goniophotometer shows good agreement for wavelengths from 420 to 700 nm.

Original language	English (US)
Pages (from-to)	140-146
Number of pages	7
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1537
DOIs	https://doi.org/10.1117/12.48878
State	Published - Dec 1 1991
Event	Underwater Imaging, Photography, and Visibility 1991 - San Diego, United States Duration: Jul 21 1991 → …

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.48878

Fingerprint Dive into the research topics of 'Submerged reflectance measurements as a function of visible wavelength'. Together they form a unique fingerprint.

Cite this

@article{a03dd5beea63441e8265c15859c5f3a2,

title = "Submerged reflectance measurements as a function of visible wavelength",

abstract = "Submerged spectral reflectance measurements made on paint samples using two different techniques are compared. With the first technique spectral measurements are made with a simple thin water film measurement technique originally used for photopic viewing. A comparison of these measurements with a second technique in which the measured sample is immersed in water in a cylindrical container and the submerged reflectance is measured with a goniophotometer shows good agreement for wavelengths from 420 to 700 nm.",

author = "Giles, {John W.} and Voss, {Kenneth J.}",

year = "1991",

month = dec,

day = "1",

doi = "10.1117/12.48878",

language = "English (US)",

volume = "1537",

pages = "140--146",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Underwater Imaging, Photography, and Visibility 1991 ; Conference date: 21-07-1991",

}

TY - JOUR

T1 - Submerged reflectance measurements as a function of visible wavelength

AU - Giles, John W.

AU - Voss, Kenneth J.

PY - 1991/12/1

Y1 - 1991/12/1

N2 - Submerged spectral reflectance measurements made on paint samples using two different techniques are compared. With the first technique spectral measurements are made with a simple thin water film measurement technique originally used for photopic viewing. A comparison of these measurements with a second technique in which the measured sample is immersed in water in a cylindrical container and the submerged reflectance is measured with a goniophotometer shows good agreement for wavelengths from 420 to 700 nm.

AB - Submerged spectral reflectance measurements made on paint samples using two different techniques are compared. With the first technique spectral measurements are made with a simple thin water film measurement technique originally used for photopic viewing. A comparison of these measurements with a second technique in which the measured sample is immersed in water in a cylindrical container and the submerged reflectance is measured with a goniophotometer shows good agreement for wavelengths from 420 to 700 nm.

UR - http://www.scopus.com/inward/record.url?scp=0037939717&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037939717&partnerID=8YFLogxK

U2 - 10.1117/12.48878

DO - 10.1117/12.48878

M3 - Conference article

AN - SCOPUS:0037939717

VL - 1537

SP - 140

EP - 146

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

T2 - Underwater Imaging, Photography, and Visibility 1991

Y2 - 21 July 1991

ER -

Submerged reflectance measurements as a function of visible wavelength

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Cite this