Abstract
Submerged spectral reflectance measurements made on paint samples using two different techniques are compared. With the first technique spectral measurements are made with a simple thin water film measurement technique originally used for photopic viewing. A comparison of these measurements with a second technique in which the measured sample is immersed in water in a cylindrical container and the submerged reflectance is measured with a goniophotometer shows good agreement for wavelengths from 420 to 700 nm.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 140-146 |
| Number of pages | 7 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 1537 |
| DOIs | |
| State | Published - Dec 1 1991 |
| Event | Underwater Imaging, Photography, and Visibility 1991 - San Diego, United States Duration: Jul 21 1991 → … |
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ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Cite this
Submerged reflectance measurements as a function of visible wavelength. / Giles, John W.; Voss, Kenneth J.
In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 1537, 01.12.1991, p. 140-146.Research output: Contribution to journal › Conference article
}
TY - JOUR
T1 - Submerged reflectance measurements as a function of visible wavelength
AU - Giles, John W.
AU - Voss, Kenneth J.
PY - 1991/12/1
Y1 - 1991/12/1
N2 - Submerged spectral reflectance measurements made on paint samples using two different techniques are compared. With the first technique spectral measurements are made with a simple thin water film measurement technique originally used for photopic viewing. A comparison of these measurements with a second technique in which the measured sample is immersed in water in a cylindrical container and the submerged reflectance is measured with a goniophotometer shows good agreement for wavelengths from 420 to 700 nm.
AB - Submerged spectral reflectance measurements made on paint samples using two different techniques are compared. With the first technique spectral measurements are made with a simple thin water film measurement technique originally used for photopic viewing. A comparison of these measurements with a second technique in which the measured sample is immersed in water in a cylindrical container and the submerged reflectance is measured with a goniophotometer shows good agreement for wavelengths from 420 to 700 nm.
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UR - http://www.scopus.com/inward/citedby.url?scp=0037939717&partnerID=8YFLogxK
U2 - 10.1117/12.48878
DO - 10.1117/12.48878
M3 - Conference article
AN - SCOPUS:0037939717
VL - 1537
SP - 140
EP - 146
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
SN - 0277-786X
ER -