Sub-Rayleigh limit localization with a spatial mode analyzer

J. Hassett, T. Malhorta, M. A. Alonso, R. W. Boyd, Seyed Mohammad Hashemi Rafsanjani, A. N. Vamivakas

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A spatial mode analyzer based on a generalized Michelson interferometer is applied to the estimation of sub-Rayleigh limit incoherent point source separations. Proof-of-principle experimental measurements of a single shifted source are presented.

Original languageEnglish (US)
Title of host publicationFrontiers in Optics, FIO 2018
PublisherOSA - The Optical Society
ISBN (Print)9781943580460
DOIs
StatePublished - Jan 1 2018
Externally publishedYes
EventFrontiers in Optics, FIO 2018 - Washington, DC, United States
Duration: Sep 16 2018Sep 20 2018

Publication series

NameOptics InfoBase Conference Papers
VolumePart F114-FIO 2018

Other

OtherFrontiers in Optics, FIO 2018
Country/TerritoryUnited States
CityWashington, DC
Period9/16/189/20/18

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Fingerprint

Dive into the research topics of 'Sub-Rayleigh limit localization with a spatial mode analyzer'. Together they form a unique fingerprint.

Cite this