Spin-polarized nanodevice for future information technologies

S. Mukherjee, R. Chantrell, X. Wu, J. A. Bain, R. Carley, K. Howard, D. Litvinov, S. Khizroev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, an experimental and theoretical study of a continuous magnetic junction of the nanoscale size is presented. Such nanosize junction was created in a thin film Permalloy (Ni/Fe 80/20) layer via focused ion beam etching (FIB) etching. The specially developed FIB process allows for creating continuous magnetic bridges with dimensions in the nanoscale range. The geometry of the structure is chosen with the purpose to create a condition for triggering a magnetic wall, as the external magnetic field is applied.

Original languageEnglish (US)
Title of host publicationIntermag 2003 - Program of the 2003 IEEE International Magnetics Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780376471, 9780780376472
DOIs
StatePublished - 2003
Externally publishedYes
Event2003 IEEE International Magnetics Conference, Intermag 2003 - Boston, United States
Duration: Mar 30 2003Apr 3 2003

Publication series

NameIntermag 2003 - Program of the 2003 IEEE International Magnetics Conference

Conference

Conference2003 IEEE International Magnetics Conference, Intermag 2003
Country/TerritoryUnited States
CityBoston
Period3/30/034/3/03

Keywords

  • Anisotropic magnetoresistance
  • Large Hadron Collider
  • Magnetic anisotropy
  • Magnetic devices
  • Magnetic fields
  • Magnetic sensors
  • Nanoscale devices
  • Perpendicular magnetic anisotropy
  • Testing
  • Transistors

ASJC Scopus subject areas

  • Engineering(all)

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