Smooth surface roughness of silanized CdSe(ZnS) quantum dots

Jianmin Xu, Chengshan Wang, Jinhai Wang, Qun Huo, Nicholas F. Crawford, Eduardo A. Véliz, Roger Leblanc

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The interparticle distance of CdSe(ZnS) quantum dots was accurately controlled by polymerization at the air-water interface which provided an increased homogeneity of the Langmuir-Blodgett film leading to a surface smoothness comparable to mica. The choice of a silane derivative is based on the fact that silicon is semiconductor, and the compound CdSe being the core of the quantum dot is also semiconductor. The combination of the two semiconductors could bring some unusual conduction properties as a polymeric silanized network. But first, it is most important to characterize the smoothness of the surface, which might be correlated to the formation of "trap" states, i.e. the photo-excited electron can fall, or the photo-excited hole can "float" One will focus our research strategy, as a pilot study, to characterize the surface of the new polymeric material.

Original languageEnglish
Pages (from-to)21-28
Number of pages8
JournalJournal of Colloid and Interface Science
Volume393
Issue number1
DOIs
StatePublished - Mar 1 2013

Fingerprint

Semiconductor quantum dots
Surface roughness
Semiconductor materials
Silanes
Langmuir Blodgett films
Mica
Silicon
Polymerization
Derivatives
Electrons
Water
Polymers
Air
mica

Keywords

  • Langmuir monolayer
  • Langmuir-Blodgett films
  • Quantum dots
  • Sol-gel process

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Colloid and Surface Chemistry

Cite this

Smooth surface roughness of silanized CdSe(ZnS) quantum dots. / Xu, Jianmin; Wang, Chengshan; Wang, Jinhai; Huo, Qun; Crawford, Nicholas F.; Véliz, Eduardo A.; Leblanc, Roger.

In: Journal of Colloid and Interface Science, Vol. 393, No. 1, 01.03.2013, p. 21-28.

Research output: Contribution to journalArticle

Xu, Jianmin ; Wang, Chengshan ; Wang, Jinhai ; Huo, Qun ; Crawford, Nicholas F. ; Véliz, Eduardo A. ; Leblanc, Roger. / Smooth surface roughness of silanized CdSe(ZnS) quantum dots. In: Journal of Colloid and Interface Science. 2013 ; Vol. 393, No. 1. pp. 21-28.
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