Simulations of nanowire bend tests for extracting mechanical properties

Emrah Celik, I. Guven, E. Madenci

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

Mechanical properties of nickel nanowires are characterized based on the numerical simulations of bend tests performed with a customized atomic force microscope (AFM) and scanning electron microscope (SEM). Nickel nanowire specimens are subjected to bending loads by the tip of the AFM cantilever. The experimental force versus bending displacement curves are compared against simulations from finite element analysis and peridynamic theory, and the mechanical properties are extracted based on their best correlations. Similarly, SEM images of fractured nanowires are compared against peridynamic failure simulations. The results of this study reveal that nickel nanowires have significantly higher strengths than their bulk counterparts, although their elastic modulus values are comparable to bulk nickel modulus values.

Original languageEnglish (US)
Pages (from-to)185-191
Number of pages7
JournalTheoretical and Applied Fracture Mechanics
Volume55
Issue number3
DOIs
StatePublished - Jun 2011
Externally publishedYes

Fingerprint

bend tests
Nanowires
Nickel
Mechanical Properties
nanowires
nickel
mechanical properties
Mechanical properties
Atomic Force Microscope
Scanning Electron Microscope
Simulation
Microscopes
Electron microscopes
simulation
electron microscopes
microscopes
Scanning
scanning
Cantilever
Elastic Modulus

Keywords

  • Modulus
  • Nanowires
  • Yield stress

ASJC Scopus subject areas

  • Applied Mathematics
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering

Cite this

Simulations of nanowire bend tests for extracting mechanical properties. / Celik, Emrah; Guven, I.; Madenci, E.

In: Theoretical and Applied Fracture Mechanics, Vol. 55, No. 3, 06.2011, p. 185-191.

Research output: Contribution to journalArticle

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