Scanning tunneling and atomic force microscopy studies of Langmuir-Blodgett films

J. A. DeRose; R. M. Leblanc

doi:10.1016/0167-5729(95)00003-8

Scanning tunneling and atomic force microscopy studies of Langmuir-Blodgett films

J. A. DeRose, R. M. Leblanc

Chemistry

Research output: Contribution to journal › Article › peer-review

53 Scopus citations

Abstract

In recent years, scanning probe microscopes (SPM), specifically the scanning tunneling (STM) and atomic force microscope (AFM), have made it possible to study molecules and molecular assemblies with nanometer (nm) or better resolution not only in vacuum, but also in air and solution. The scanning probe microscopes are able to obtain information about a material's topography (surface structure) by scanning avery sharp probe extremely close to it. Many advances in Langmuir-Blodgett (LB) film high technology, in particular molecular electronics, have occurred over the last few years. Some of these advances came from the results of scanning probe microscopy. This report discusses the contributions of scanning probe microscopy to the field of Langmuir-Blodgett films over the last nine years.

Original language	English (US)
Pages (from-to)	73-126
Number of pages	54
Journal	Surface Science Reports
Volume	22
Issue number	3
DOIs	https://doi.org/10.1016/0167-5729(95)00003-8
State	Published - 1995

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Chemistry(all)
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

Access to Document

10.1016/0167-5729(95)00003-8

Cite this

@article{af524d4474534404855d8b909387b349,

title = "Scanning tunneling and atomic force microscopy studies of Langmuir-Blodgett films",

abstract = "In recent years, scanning probe microscopes (SPM), specifically the scanning tunneling (STM) and atomic force microscope (AFM), have made it possible to study molecules and molecular assemblies with nanometer (nm) or better resolution not only in vacuum, but also in air and solution. The scanning probe microscopes are able to obtain information about a material's topography (surface structure) by scanning avery sharp probe extremely close to it. Many advances in Langmuir-Blodgett (LB) film high technology, in particular molecular electronics, have occurred over the last few years. Some of these advances came from the results of scanning probe microscopy. This report discusses the contributions of scanning probe microscopy to the field of Langmuir-Blodgett films over the last nine years.",

author = "DeRose, {J. A.} and Leblanc, {R. M.}",

year = "1995",

doi = "10.1016/0167-5729(95)00003-8",

language = "English (US)",

volume = "22",

pages = "73--126",

journal = "Surface Science Reports",

issn = "0167-5729",

publisher = "Elsevier",

number = "3",

}

TY - JOUR

T1 - Scanning tunneling and atomic force microscopy studies of Langmuir-Blodgett films

AU - DeRose, J. A.

AU - Leblanc, R. M.

PY - 1995

Y1 - 1995

N2 - In recent years, scanning probe microscopes (SPM), specifically the scanning tunneling (STM) and atomic force microscope (AFM), have made it possible to study molecules and molecular assemblies with nanometer (nm) or better resolution not only in vacuum, but also in air and solution. The scanning probe microscopes are able to obtain information about a material's topography (surface structure) by scanning avery sharp probe extremely close to it. Many advances in Langmuir-Blodgett (LB) film high technology, in particular molecular electronics, have occurred over the last few years. Some of these advances came from the results of scanning probe microscopy. This report discusses the contributions of scanning probe microscopy to the field of Langmuir-Blodgett films over the last nine years.

AB - In recent years, scanning probe microscopes (SPM), specifically the scanning tunneling (STM) and atomic force microscope (AFM), have made it possible to study molecules and molecular assemblies with nanometer (nm) or better resolution not only in vacuum, but also in air and solution. The scanning probe microscopes are able to obtain information about a material's topography (surface structure) by scanning avery sharp probe extremely close to it. Many advances in Langmuir-Blodgett (LB) film high technology, in particular molecular electronics, have occurred over the last few years. Some of these advances came from the results of scanning probe microscopy. This report discusses the contributions of scanning probe microscopy to the field of Langmuir-Blodgett films over the last nine years.

UR - http://www.scopus.com/inward/record.url?scp=12844268321&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=12844268321&partnerID=8YFLogxK

U2 - 10.1016/0167-5729(95)00003-8

DO - 10.1016/0167-5729(95)00003-8

M3 - Article

AN - SCOPUS:12844268321

VL - 22

SP - 73

EP - 126

JO - Surface Science Reports

JF - Surface Science Reports

SN - 0167-5729

IS - 3

ER -

Scanning tunneling and atomic force microscopy studies of Langmuir-Blodgett films

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this