Scanning tunneling and atomic force microscopy studies of Langmuir-Blodgett films

J. A. DeRose, Roger Leblanc

Research output: Contribution to journalArticle

54 Citations (Scopus)

Abstract

In recent years, scanning probe microscopes (SPM), specifically the scanning tunneling (STM) and atomic force microscope (AFM), have made it possible to study molecules and molecular assemblies with nanometer (nm) or better resolution not only in vacuum, but also in air and solution. The scanning probe microscopes are able to obtain information about a material's topography (surface structure) by scanning avery sharp probe extremely close to it. Many advances in Langmuir-Blodgett (LB) film high technology, in particular molecular electronics, have occurred over the last few years. Some of these advances came from the results of scanning probe microscopy. This report discusses the contributions of scanning probe microscopy to the field of Langmuir-Blodgett films over the last nine years.

Original languageEnglish
Pages (from-to)73-126
Number of pages54
JournalSurface Science Reports
Volume22
Issue number3
DOIs
StatePublished - Jan 1 1995

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Langmuir Blodgett films
Langmuir-Blodgett films
Atomic force microscopy
atomic force microscopy
Scanning
Scanning probe microscopy
Microscopes
scanning
probes
microscopes
Molecular electronics
Surface structure
Topography
microscopy
molecular electronics
Vacuum
assemblies
Molecules
topography
Air

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Metals and Alloys
  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Scanning tunneling and atomic force microscopy studies of Langmuir-Blodgett films. / DeRose, J. A.; Leblanc, Roger.

In: Surface Science Reports, Vol. 22, No. 3, 01.01.1995, p. 73-126.

Research output: Contribution to journalArticle

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