Abstract
In recent years, scanning probe microscopes (SPM), specifically the scanning tunneling (STM) and atomic force microscope (AFM), have made it possible to study molecules and molecular assemblies with nanometer (nm) or better resolution not only in vacuum, but also in air and solution. The scanning probe microscopes are able to obtain information about a material's topography (surface structure) by scanning avery sharp probe extremely close to it. Many advances in Langmuir-Blodgett (LB) film high technology, in particular molecular electronics, have occurred over the last few years. Some of these advances came from the results of scanning probe microscopy. This report discusses the contributions of scanning probe microscopy to the field of Langmuir-Blodgett films over the last nine years.
| Original language | English |
|---|---|
| Pages (from-to) | 73-126 |
| Number of pages | 54 |
| Journal | Surface Science Reports |
| Volume | 22 |
| Issue number | 3 |
| DOIs | |
| State | Published - Jan 1 1995 |
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ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Metals and Alloys
- Surfaces, Coatings and Films
- Condensed Matter Physics
- Surfaces and Interfaces
Cite this
Scanning tunneling and atomic force microscopy studies of Langmuir-Blodgett films. / DeRose, J. A.; Leblanc, Roger.
In: Surface Science Reports, Vol. 22, No. 3, 01.01.1995, p. 73-126.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Scanning tunneling and atomic force microscopy studies of Langmuir-Blodgett films
AU - DeRose, J. A.
AU - Leblanc, Roger
PY - 1995/1/1
Y1 - 1995/1/1
N2 - In recent years, scanning probe microscopes (SPM), specifically the scanning tunneling (STM) and atomic force microscope (AFM), have made it possible to study molecules and molecular assemblies with nanometer (nm) or better resolution not only in vacuum, but also in air and solution. The scanning probe microscopes are able to obtain information about a material's topography (surface structure) by scanning avery sharp probe extremely close to it. Many advances in Langmuir-Blodgett (LB) film high technology, in particular molecular electronics, have occurred over the last few years. Some of these advances came from the results of scanning probe microscopy. This report discusses the contributions of scanning probe microscopy to the field of Langmuir-Blodgett films over the last nine years.
AB - In recent years, scanning probe microscopes (SPM), specifically the scanning tunneling (STM) and atomic force microscope (AFM), have made it possible to study molecules and molecular assemblies with nanometer (nm) or better resolution not only in vacuum, but also in air and solution. The scanning probe microscopes are able to obtain information about a material's topography (surface structure) by scanning avery sharp probe extremely close to it. Many advances in Langmuir-Blodgett (LB) film high technology, in particular molecular electronics, have occurred over the last few years. Some of these advances came from the results of scanning probe microscopy. This report discusses the contributions of scanning probe microscopy to the field of Langmuir-Blodgett films over the last nine years.
UR - http://www.scopus.com/inward/record.url?scp=12844268321&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=12844268321&partnerID=8YFLogxK
U2 - 10.1016/0167-5729(95)00003-8
DO - 10.1016/0167-5729(95)00003-8
M3 - Article
VL - 22
SP - 73
EP - 126
JO - Surface Science Reports
JF - Surface Science Reports
SN - 0167-5729
IS - 3
ER -