Reflection high-energy electron diffraction based texture determination: Magnetic thin films for perpendicular media

Dmitri Litvinov, J. Kent Howard, Sakhrat Khizroev, Heng Gong, David Lambeth

Research output: Contribution to journalConference articlepeer-review

11 Scopus citations

Abstract

Application of reflection high-energy electron diffraction (RHEED) to texture determination is demonstrated for magnetic thin film applications. Diffraction pattern analysis based on kinematic theory of RHEED is outlined. Application of the technique is demonstrated for texture characterization of hexagonal-close-packed CoCr alloys that are used as recording layers in perpendicular recording media. It is shown that both texture orientation and texture angular dispersion extracted from RHEED patterns are in agreement with the data obtained using x-ray diffraction.

Original languageEnglish (US)
Pages (from-to)5693-5695
Number of pages3
JournalJournal of Applied Physics
Volume87
Issue number9 II
DOIs
StatePublished - May 2000
Externally publishedYes
Event44th Annual Conference on Magnetism and Magnetic Materials - San Jose, CA, United States
Duration: Nov 15 1999Nov 18 1999

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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