Recording Heads with Track Widths Suitable for 100 Gbit/in 2 Density

S. K. Khizroev, M. H. Kryder, Y. Ikeda, K. Rubin, P. Arnett, M. Best, D. A. Thompson

Research output: Contribution to journalArticlepeer-review

44 Scopus citations


Focused ion beam etching has been used to trim both longitudinal and perpendicular recording heads with track widths as narrow as 60 nm. 3D boundary element modeling has been used to optimize trimming parameters. Tracks written with the trimmed heads using spin-stands and imaged using magnetic force microscopy were as narrow as 100 nm.

Original languageEnglish (US)
Pages (from-to)2544-2546
Number of pages3
JournalIEEE Transactions on Magnetics
Issue number5 PART 1
StatePublished - 1999
Externally publishedYes


  • Fib trimming
  • Magnetic recording with densities above 100 gbit/in
  • Perpendicular recording

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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