Probing the forces between complementary strands of DNA with the atomic force microscope

Vincent T. Moy; Ernst Ludwig Florin; Matthias Rief; Horst Lehmann; Markus Ludwig; Hermann E. Gaub; Klaus Dornmair

Probing the forces between complementary strands of DNA with the atomic force microscope

Vincent T. Moy, Ernst Ludwig Florin, Matthias Rief, Horst Lehmann, Markus Ludwig, Hermann E. Gaub, Klaus Dornmair

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The atomic force microscope (AFM) is capable of measuring the interaction between tip and sample with high sensitivity and unparalleled spatial resolution. The chemical functionalization of the AFM tips has expanded the versatility of the AFM to experiments where specific molecular interactions are measured. We present here measurements of the interaction between complementary strands of DNA. A necessary prerequisite for the quantitative analysis of the interaction force is knowledge of the spring constant of the cantilevers. We report a method that allows for the in situ measurement of the absolute value of the spring constant of cantilevers based on spectral analysis of the thermal excitations of the cantilever.

Original language	English (US)
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Editors	Mehdi Vaez-Iravani
Publisher	Society of Photo-Optical Instrumentation Engineers
Pages	2-12
Number of pages	11
ISBN (Print)	0819417319
State	Published - Jan 1 1995
Externally published	Yes
Event	Scanning Probe Microscopies III - San Jose, CA, USA Duration: Feb 6 1995 → Feb 7 1995

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	2384
ISSN (Print)	0277-786X

Other

Other	Scanning Probe Microscopies III
City	San Jose, CA, USA
Period	2/6/95 → 2/7/95

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

Fingerprint Dive into the research topics of 'Probing the forces between complementary strands of DNA with the atomic force microscope'. Together they form a unique fingerprint.

Cite this

Moy, V. T., Florin, E. L., Rief, M., Lehmann, H., Ludwig, M., Gaub, H. E., & Dornmair, K. (1995). Probing the forces between complementary strands of DNA with the atomic force microscope. In M. Vaez-Iravani (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 2-12). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2384). Society of Photo-Optical Instrumentation Engineers.

Probing the forces between complementary strands of DNA with the atomic force microscope. / Moy, Vincent T.; Florin, Ernst Ludwig; Rief, Matthias; Lehmann, Horst; Ludwig, Markus; Gaub, Hermann E.; Dornmair, Klaus.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Mehdi Vaez-Iravani. Society of Photo-Optical Instrumentation Engineers, 1995. p. 2-12 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2384).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Moy, VT, Florin, EL, Rief, M, Lehmann, H, Ludwig, M, Gaub, HE & Dornmair, K 1995, Probing the forces between complementary strands of DNA with the atomic force microscope. in M Vaez-Iravani (ed.), Proceedings of SPIE - The International Society for Optical Engineering. Proceedings of SPIE - The International Society for Optical Engineering, vol. 2384, Society of Photo-Optical Instrumentation Engineers, pp. 2-12, Scanning Probe Microscopies III, San Jose, CA, USA, 2/6/95.

Moy VT, Florin EL, Rief M, Lehmann H, Ludwig M, Gaub HE et al. Probing the forces between complementary strands of DNA with the atomic force microscope. In Vaez-Iravani M, editor, Proceedings of SPIE - The International Society for Optical Engineering. Society of Photo-Optical Instrumentation Engineers. 1995. p. 2-12. (Proceedings of SPIE - The International Society for Optical Engineering).

Moy, Vincent T. ; Florin, Ernst Ludwig ; Rief, Matthias ; Lehmann, Horst ; Ludwig, Markus ; Gaub, Hermann E. ; Dornmair, Klaus. / Probing the forces between complementary strands of DNA with the atomic force microscope. Proceedings of SPIE - The International Society for Optical Engineering. editor / Mehdi Vaez-Iravani. Society of Photo-Optical Instrumentation Engineers, 1995. pp. 2-12 (Proceedings of SPIE - The International Society for Optical Engineering).

@inproceedings{2dde133b316c437a909b3449103fc434,

title = "Probing the forces between complementary strands of DNA with the atomic force microscope",

abstract = "The atomic force microscope (AFM) is capable of measuring the interaction between tip and sample with high sensitivity and unparalleled spatial resolution. The chemical functionalization of the AFM tips has expanded the versatility of the AFM to experiments where specific molecular interactions are measured. We present here measurements of the interaction between complementary strands of DNA. A necessary prerequisite for the quantitative analysis of the interaction force is knowledge of the spring constant of the cantilevers. We report a method that allows for the in situ measurement of the absolute value of the spring constant of cantilevers based on spectral analysis of the thermal excitations of the cantilever.",

author = "Moy, {Vincent T.} and Florin, {Ernst Ludwig} and Matthias Rief and Horst Lehmann and Markus Ludwig and Gaub, {Hermann E.} and Klaus Dornmair",

year = "1995",

month = jan,

day = "1",

language = "English (US)",

isbn = "0819417319",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "Society of Photo-Optical Instrumentation Engineers",

pages = "2--12",

editor = "Mehdi Vaez-Iravani",

booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

note = "Scanning Probe Microscopies III ; Conference date: 06-02-1995 Through 07-02-1995",

}

TY - GEN

T1 - Probing the forces between complementary strands of DNA with the atomic force microscope

AU - Moy, Vincent T.

AU - Florin, Ernst Ludwig

AU - Rief, Matthias

AU - Lehmann, Horst

AU - Ludwig, Markus

AU - Gaub, Hermann E.

AU - Dornmair, Klaus

PY - 1995/1/1

Y1 - 1995/1/1

N2 - The atomic force microscope (AFM) is capable of measuring the interaction between tip and sample with high sensitivity and unparalleled spatial resolution. The chemical functionalization of the AFM tips has expanded the versatility of the AFM to experiments where specific molecular interactions are measured. We present here measurements of the interaction between complementary strands of DNA. A necessary prerequisite for the quantitative analysis of the interaction force is knowledge of the spring constant of the cantilevers. We report a method that allows for the in situ measurement of the absolute value of the spring constant of cantilevers based on spectral analysis of the thermal excitations of the cantilever.

AB - The atomic force microscope (AFM) is capable of measuring the interaction between tip and sample with high sensitivity and unparalleled spatial resolution. The chemical functionalization of the AFM tips has expanded the versatility of the AFM to experiments where specific molecular interactions are measured. We present here measurements of the interaction between complementary strands of DNA. A necessary prerequisite for the quantitative analysis of the interaction force is knowledge of the spring constant of the cantilevers. We report a method that allows for the in situ measurement of the absolute value of the spring constant of cantilevers based on spectral analysis of the thermal excitations of the cantilever.

UR - http://www.scopus.com/inward/record.url?scp=0029213838&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0029213838&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0029213838

SN - 0819417319

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 2

EP - 12

BT - Proceedings of SPIE - The International Society for Optical Engineering

A2 - Vaez-Iravani, Mehdi

PB - Society of Photo-Optical Instrumentation Engineers

T2 - Scanning Probe Microscopies III

Y2 - 6 February 1995 through 7 February 1995

ER -