Abstract
The atomic force microscope (AFM) is capable of measuring the interaction between tip and sample with high sensitivity and unparalleled spatial resolution. The chemical functionalization of the AFM tips has expanded the versatility of the AFM to experiments where specific molecular interactions are measured. We present here measurements of the interaction between complementary strands of DNA. A necessary prerequisite for the quantitative analysis of the interaction force is knowledge of the spring constant of the cantilevers. We report a method that allows for the in situ measurement of the absolute value of the spring constant of cantilevers based on spectral analysis of the thermal excitations of the cantilever.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Editors | Mehdi Vaez-Iravani |
| Place of Publication | Bellingham, WA, United States |
| Publisher | Society of Photo-Optical Instrumentation Engineers |
| Pages | 2-12 |
| Number of pages | 11 |
| Volume | 2384 |
| ISBN (Print) | 0819417319 |
| State | Published - Jan 1 1995 |
| Externally published | Yes |
| Event | Scanning Probe Microscopies III - San Jose, CA, USA Duration: Feb 6 1995 → Feb 7 1995 |
Other
| Other | Scanning Probe Microscopies III |
|---|---|
| City | San Jose, CA, USA |
| Period | 2/6/95 → 2/7/95 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
Cite this
Probing the forces between complementary strands of DNA with the atomic force microscope. / Moy, Vincent T.; Florin, Ernst Ludwig; Rief, Matthias; Lehmann, Horst; Ludwig, Markus; Gaub, Hermann E.; Dornmair, Klaus.
Proceedings of SPIE - The International Society for Optical Engineering. ed. / Mehdi Vaez-Iravani. Vol. 2384 Bellingham, WA, United States : Society of Photo-Optical Instrumentation Engineers, 1995. p. 2-12.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Probing the forces between complementary strands of DNA with the atomic force microscope
AU - Moy, Vincent T.
AU - Florin, Ernst Ludwig
AU - Rief, Matthias
AU - Lehmann, Horst
AU - Ludwig, Markus
AU - Gaub, Hermann E.
AU - Dornmair, Klaus
PY - 1995/1/1
Y1 - 1995/1/1
N2 - The atomic force microscope (AFM) is capable of measuring the interaction between tip and sample with high sensitivity and unparalleled spatial resolution. The chemical functionalization of the AFM tips has expanded the versatility of the AFM to experiments where specific molecular interactions are measured. We present here measurements of the interaction between complementary strands of DNA. A necessary prerequisite for the quantitative analysis of the interaction force is knowledge of the spring constant of the cantilevers. We report a method that allows for the in situ measurement of the absolute value of the spring constant of cantilevers based on spectral analysis of the thermal excitations of the cantilever.
AB - The atomic force microscope (AFM) is capable of measuring the interaction between tip and sample with high sensitivity and unparalleled spatial resolution. The chemical functionalization of the AFM tips has expanded the versatility of the AFM to experiments where specific molecular interactions are measured. We present here measurements of the interaction between complementary strands of DNA. A necessary prerequisite for the quantitative analysis of the interaction force is knowledge of the spring constant of the cantilevers. We report a method that allows for the in situ measurement of the absolute value of the spring constant of cantilevers based on spectral analysis of the thermal excitations of the cantilever.
UR - http://www.scopus.com/inward/record.url?scp=0029213838&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0029213838&partnerID=8YFLogxK
M3 - Conference contribution
SN - 0819417319
VL - 2384
SP - 2
EP - 12
BT - Proceedings of SPIE - The International Society for Optical Engineering
A2 - Vaez-Iravani, Mehdi
PB - Society of Photo-Optical Instrumentation Engineers
CY - Bellingham, WA, United States
ER -