Probing the forces between complementary strands of DNA with the atomic force microscope

Vincent T. Moy, Ernst Ludwig Florin, Matthias Rief, Horst Lehmann, Markus Ludwig, Hermann E. Gaub, Klaus Dornmair

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

The atomic force microscope (AFM) is capable of measuring the interaction between tip and sample with high sensitivity and unparalleled spatial resolution. The chemical functionalization of the AFM tips has expanded the versatility of the AFM to experiments where specific molecular interactions are measured. We present here measurements of the interaction between complementary strands of DNA. A necessary prerequisite for the quantitative analysis of the interaction force is knowledge of the spring constant of the cantilevers. We report a method that allows for the in situ measurement of the absolute value of the spring constant of cantilevers based on spectral analysis of the thermal excitations of the cantilever.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsMehdi Vaez-Iravani
Place of PublicationBellingham, WA, United States
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages2-12
Number of pages11
Volume2384
ISBN (Print)0819417319
StatePublished - Jan 1 1995
Externally publishedYes
EventScanning Probe Microscopies III - San Jose, CA, USA
Duration: Feb 6 1995Feb 7 1995

Other

OtherScanning Probe Microscopies III
CitySan Jose, CA, USA
Period2/6/952/7/95

Fingerprint

strands
Microscopes
DNA
deoxyribonucleic acid
microscopes
Molecular interactions
Spectrum analysis
interactions
molecular interactions
versatility
in situ measurement
quantitative analysis
spectrum analysis
spatial resolution
Chemical analysis
sensitivity
Experiments
excitation
Hot Temperature

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Moy, V. T., Florin, E. L., Rief, M., Lehmann, H., Ludwig, M., Gaub, H. E., & Dornmair, K. (1995). Probing the forces between complementary strands of DNA with the atomic force microscope. In M. Vaez-Iravani (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 2384, pp. 2-12). Bellingham, WA, United States: Society of Photo-Optical Instrumentation Engineers.

Probing the forces between complementary strands of DNA with the atomic force microscope. / Moy, Vincent T.; Florin, Ernst Ludwig; Rief, Matthias; Lehmann, Horst; Ludwig, Markus; Gaub, Hermann E.; Dornmair, Klaus.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / Mehdi Vaez-Iravani. Vol. 2384 Bellingham, WA, United States : Society of Photo-Optical Instrumentation Engineers, 1995. p. 2-12.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Moy, VT, Florin, EL, Rief, M, Lehmann, H, Ludwig, M, Gaub, HE & Dornmair, K 1995, Probing the forces between complementary strands of DNA with the atomic force microscope. in M Vaez-Iravani (ed.), Proceedings of SPIE - The International Society for Optical Engineering. vol. 2384, Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States, pp. 2-12, Scanning Probe Microscopies III, San Jose, CA, USA, 2/6/95.
Moy VT, Florin EL, Rief M, Lehmann H, Ludwig M, Gaub HE et al. Probing the forces between complementary strands of DNA with the atomic force microscope. In Vaez-Iravani M, editor, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 2384. Bellingham, WA, United States: Society of Photo-Optical Instrumentation Engineers. 1995. p. 2-12
Moy, Vincent T. ; Florin, Ernst Ludwig ; Rief, Matthias ; Lehmann, Horst ; Ludwig, Markus ; Gaub, Hermann E. ; Dornmair, Klaus. / Probing the forces between complementary strands of DNA with the atomic force microscope. Proceedings of SPIE - The International Society for Optical Engineering. editor / Mehdi Vaez-Iravani. Vol. 2384 Bellingham, WA, United States : Society of Photo-Optical Instrumentation Engineers, 1995. pp. 2-12
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