Physical oceanographic research using the attended profiling current meter (APCM) and the cyclesonde

John Van Leer, Kevin D. Leaman

Research output: Contribution to conferencePaper

Abstract

About half the physical oceanographic observations at the University of Miami are current profile measurements. These measurements are gathered by two distinct methods: the Attended Profiling Current Meter (APCM), which has been primarily developed and used by Br. Walter Duing in his studies of intense ocean currents such as the Gulf Stream, the Equatorial Current and the Somali Current where near-surface current meter moorings are impractical or high vertical resolution velocity data are required; the second method involves the use of an automatic unattended current profiler-the Cyclesonde. The Cyclesonde, developed by John Van Leer, has been used to study current profiles on continental shelves and in the upper 300 meters where long time series of CTD/velocity profiles are desired or where profile array data with a single ship are available. Time series profiles are particularly useful in studying inertial waves, mixing processes, bottom and surface boundary layers or complex mean flow patterns associated with fronts. About 20,000 velocity profiles have been collected by APCM and Cyclesonde techniques. The principal source of error in the APCM is navigational uncertainty in the ship 's position, which is required to convert the velocity profile relative to the ship into absolute velocity profiles. Other errors include time lag, angle offset, rotor shading and surface wave pump up. The roller coupling used in both methods greatly reduces the surface wave noise introduced in the speed sensor at depths below the zone of direct wave orbital influence. Typical APCM errors are 3-5 cm and Cyclesonde errors are 1-3 cm/sec, compared to fixed level current meters or other profiling techniques.

Original languageEnglish (US)
Pages77-93
Number of pages17
DOIs
StatePublished - Jan 1 1978
Event1st IEEE Working Conference on Current Measurement, CCM 1978 - Newark, United States
Duration: Jan 11 1978Jan 13 1978

Conference

Conference1st IEEE Working Conference on Current Measurement, CCM 1978
CountryUnited States
CityNewark
Period1/11/781/13/78

Fingerprint

velocity profile
surface wave
Ships
time series
Surface waves
Time series
ships
velocity distribution
profiler
shading
flow pattern
Ocean currents
continental shelf
surface layer
pump
boundary layer
Mooring
profiles
Electric current measurement
sensor

ASJC Scopus subject areas

  • Instrumentation
  • Oceanography

Cite this

Van Leer, J., & Leaman, K. D. (1978). Physical oceanographic research using the attended profiling current meter (APCM) and the cyclesonde. 77-93. Paper presented at 1st IEEE Working Conference on Current Measurement, CCM 1978, Newark, United States. https://doi.org/10.1109/CCM.1978.1158378

Physical oceanographic research using the attended profiling current meter (APCM) and the cyclesonde. / Van Leer, John; Leaman, Kevin D.

1978. 77-93 Paper presented at 1st IEEE Working Conference on Current Measurement, CCM 1978, Newark, United States.

Research output: Contribution to conferencePaper

Van Leer, J & Leaman, KD 1978, 'Physical oceanographic research using the attended profiling current meter (APCM) and the cyclesonde' Paper presented at 1st IEEE Working Conference on Current Measurement, CCM 1978, Newark, United States, 1/11/78 - 1/13/78, pp. 77-93. https://doi.org/10.1109/CCM.1978.1158378
Van Leer J, Leaman KD. Physical oceanographic research using the attended profiling current meter (APCM) and the cyclesonde. 1978. Paper presented at 1st IEEE Working Conference on Current Measurement, CCM 1978, Newark, United States. https://doi.org/10.1109/CCM.1978.1158378
Van Leer, John ; Leaman, Kevin D. / Physical oceanographic research using the attended profiling current meter (APCM) and the cyclesonde. Paper presented at 1st IEEE Working Conference on Current Measurement, CCM 1978, Newark, United States.17 p.
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