Multistate degradation and supervised estimation methods for a condition-monitored device

Ramin Moghaddass, Ming J. Zuo

Research output: Contribution to journalArticle

25 Scopus citations

Abstract

Multistate reliability has received significant attention over the past decades, particularly its application to mechanical devices that degrade over time. This degradation can be represented by a multistate continuous-time stochastic process. This article considers a device with discrete multistate degradation, which is monitored by a condition monitoring indicator through an observation process. A general stochastic process called the nonhomogeneous continuous-time hidden semi-Markov process is employed to model the degradation and observation processes associated with this type of device. Then, supervised parametric and nonparametric estimation methods are developed to estimate the maximum likelihood estimators of the main characteristics of the model. Finally, the correctness and empirical consistency of the estimators are evaluated using a simulation-based numerical experiment.

Original languageEnglish (US)
Pages (from-to)131-148
Number of pages18
JournalIIE Transactions (Institute of Industrial Engineers)
Volume46
Issue number2
DOIs
StatePublished - Jan 1 2014
Externally publishedYes

Keywords

  • Condition monitoring
  • Degradation process
  • Multistate reliability
  • Supervised estimation

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering

Fingerprint Dive into the research topics of 'Multistate degradation and supervised estimation methods for a condition-monitored device'. Together they form a unique fingerprint.

  • Cite this