Multistate Degradation and Condition Monitoring for Devices with Multiple Independent Failure Modes

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Original language	English (US)
Title of host publication	Applied Reliability Engineering and Risk Analysis
Subtitle of host publication	Probabilistic Models and Statistical Inference
Publisher	wiley
Pages	17-31
Number of pages	15
ISBN (Electronic)	9781118701881
ISBN (Print)	9781118539422
DOIs	https://doi.org/10.1002/9781118701881.ch2
State	Published - Aug 23 2013
Externally published	Yes

ASJC Scopus subject areas

@inbook{93e855a019964cdda96663558cea92ff,

title = "Multistate Degradation and Condition Monitoring for Devices with Multiple Independent Failure Modes",

author = "Ramin Moghaddass and Zuo, {Ming J.}",

year = "2013",

month = aug,

day = "23",

doi = "10.1002/9781118701881.ch2",

language = "English (US)",

isbn = "9781118539422",

pages = "17--31",

booktitle = "Applied Reliability Engineering and Risk Analysis",

publisher = "wiley",

}

TY - CHAP

T1 - Multistate Degradation and Condition Monitoring for Devices with Multiple Independent Failure Modes

AU - Moghaddass, Ramin

AU - Zuo, Ming J.

PY - 2013/8/23

Y1 - 2013/8/23

UR - http://www.scopus.com/inward/record.url?scp=84930961871&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84930961871&partnerID=8YFLogxK

U2 - 10.1002/9781118701881.ch2

DO - 10.1002/9781118701881.ch2

M3 - Chapter

AN - SCOPUS:84930961871

SN - 9781118539422

SP - 17

EP - 31

BT - Applied Reliability Engineering and Risk Analysis

PB - wiley

ER -