| Original language | English (US) |
|---|---|
| Title of host publication | Applied Reliability Engineering and Risk Analysis |
| Subtitle of host publication | Probabilistic Models and Statistical Inference |
| Publisher | wiley |
| Pages | 17-31 |
| Number of pages | 15 |
| ISBN (Electronic) | 9781118701881 |
| ISBN (Print) | 9781118539422 |
| DOIs | |
| State | Published - Aug 23 2013 |
| Externally published | Yes |
ASJC Scopus subject areas
- Engineering(all)
Cite this
Moghaddass, R., & Zuo, M. J. (2013). Multistate Degradation and Condition Monitoring for Devices with Multiple Independent Failure Modes. In Applied Reliability Engineering and Risk Analysis: Probabilistic Models and Statistical Inference (pp. 17-31). wiley. https://doi.org/10.1002/9781118701881.ch2