Multistate Degradation and Condition Monitoring for Devices with Multiple Independent Failure Modes

Ramin Moghaddass, Ming J. Zuo

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Scopus citations
Original languageEnglish (US)
Title of host publicationApplied Reliability Engineering and Risk Analysis
Subtitle of host publicationProbabilistic Models and Statistical Inference
Number of pages15
ISBN (Electronic)9781118701881
ISBN (Print)9781118539422
StatePublished - Aug 23 2013
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

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