Multistate Degradation and Condition Monitoring for Devices with Multiple Independent Failure Modes

Ramin Moghaddass, Ming J. Zuo

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Scopus citations
Original languageEnglish (US)
Title of host publicationApplied Reliability Engineering and Risk Analysis
Subtitle of host publicationProbabilistic Models and Statistical Inference
Publisherwiley
Pages17-31
Number of pages15
ISBN (Electronic)9781118701881
ISBN (Print)9781118539422
DOIs
StatePublished - Aug 23 2013
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Moghaddass, R., & Zuo, M. J. (2013). Multistate Degradation and Condition Monitoring for Devices with Multiple Independent Failure Modes. In Applied Reliability Engineering and Risk Analysis: Probabilistic Models and Statistical Inference (pp. 17-31). wiley. https://doi.org/10.1002/9781118701881.ch2