Multi-state degradation analysis for a condition monitored device with unobservable states

Ramin Moghaddass, Ming J. Zuo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

The degradation process associated with a mechanical device can be represented by a discrete type of multi-state degradation model. Each discrete state in a multi-state degradation model corresponds to a certain health status of the device. In this paper, a general type of multi-state degradation model is considered for a device for which the health states are not directly observable and instead, indirect information is available through condition monitoring. We first demonstrate how nonhomogeneous continuous-time hidden semi-Markov process can be used to model a multi-state degradation process and then briefly review an unsupervised estimation procedure, which can be used to estimate the unknown characteristics of the stochastic processes associated with the degradation process and the observation process of a multi-state device. A simple numerical example is provided to demonstrate the application of the presented model.

Original languageEnglish (US)
Title of host publicationProceedings of 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2012
Pages549-554
Number of pages6
DOIs
StatePublished - 2012
Externally publishedYes
Event2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2012 - Chengdu, China
Duration: Jun 15 2012Jun 18 2012

Other

Other2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2012
CountryChina
CityChengdu
Period6/15/126/18/12

Fingerprint

Degradation
Health
Condition monitoring
Random processes
Markov processes

Keywords

  • Condition Monitoring
  • multi-state degradation
  • semi-Markov process
  • unsupervised estimation

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality

Cite this

Moghaddass, R., & Zuo, M. J. (2012). Multi-state degradation analysis for a condition monitored device with unobservable states. In Proceedings of 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2012 (pp. 549-554). [6246295] https://doi.org/10.1109/ICQR2MSE.2012.6246295

Multi-state degradation analysis for a condition monitored device with unobservable states. / Moghaddass, Ramin; Zuo, Ming J.

Proceedings of 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2012. 2012. p. 549-554 6246295.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Moghaddass, R & Zuo, MJ 2012, Multi-state degradation analysis for a condition monitored device with unobservable states. in Proceedings of 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2012., 6246295, pp. 549-554, 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2012, Chengdu, China, 6/15/12. https://doi.org/10.1109/ICQR2MSE.2012.6246295
Moghaddass R, Zuo MJ. Multi-state degradation analysis for a condition monitored device with unobservable states. In Proceedings of 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2012. 2012. p. 549-554. 6246295 https://doi.org/10.1109/ICQR2MSE.2012.6246295
Moghaddass, Ramin ; Zuo, Ming J. / Multi-state degradation analysis for a condition monitored device with unobservable states. Proceedings of 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2012. 2012. pp. 549-554
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