MODIS polarization ray tracing analysis

N. Souaidia, D. Moyer, G. Meister, S. Pellicori, E. Waluschka, Kenneth Voss

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

On-orbit optical sensors are the primary data source for the remote sensing community. A rigorous pre-flight characterization and calibration is a key to the success of their mission. Indeed, preliminary calibration and correction factors are determined during this process. As part of this process, prior to the launch of NASA's Moderate Resolution Imaging Spectroradiometer (MODIS) its polarization sensitivity was measured. In this work, our goal was to simulate these measurements using computer ray tracing software. Based on that, we could evaluate the evolution of the different coatings (Mirror, Beam splitters, Anti-reflection and Band pass filters) due to degradation over time. We were able to simulate the measurements and obtained what the theoretical polarization sensitivity should be. The results were compared to the pre-launch measurements and an analysis of the whole MODIS optical system was performed in order to explain these differences. A full description of the MODIS polarization ray tracing procedure along with a discussion on the results and their implications on past, present and future work will be given.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsJ.A. Shaw, J.S. Tyo
Pages1-8
Number of pages8
Volume5888
DOIs
StatePublished - 2005
EventPolarization Science and Remote Sensing II - San Diego, CA, United States
Duration: Aug 2 2005Aug 4 2005

Other

OtherPolarization Science and Remote Sensing II
CountryUnited States
CitySan Diego, CA
Period8/2/058/4/05

Fingerprint

MODIS (radiometry)
Ray tracing
ray tracing
Polarization
Imaging techniques
polarization
Calibration
Optical sensors
beam splitters
optical measuring instruments
Bandpass filters
bandpass filters
Optical systems
NASA
remote sensing
Remote sensing
Mirrors
Orbits
flight
mirrors

Keywords

  • Aqua
  • Code
  • MODIS
  • Polarization
  • Ray tracing
  • Terra
  • ZEMAX

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Souaidia, N., Moyer, D., Meister, G., Pellicori, S., Waluschka, E., & Voss, K. (2005). MODIS polarization ray tracing analysis. In J. A. Shaw, & J. S. Tyo (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5888, pp. 1-8). [58880H] https://doi.org/10.1117/12.617635

MODIS polarization ray tracing analysis. / Souaidia, N.; Moyer, D.; Meister, G.; Pellicori, S.; Waluschka, E.; Voss, Kenneth.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / J.A. Shaw; J.S. Tyo. Vol. 5888 2005. p. 1-8 58880H.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Souaidia, N, Moyer, D, Meister, G, Pellicori, S, Waluschka, E & Voss, K 2005, MODIS polarization ray tracing analysis. in JA Shaw & JS Tyo (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5888, 58880H, pp. 1-8, Polarization Science and Remote Sensing II, San Diego, CA, United States, 8/2/05. https://doi.org/10.1117/12.617635
Souaidia N, Moyer D, Meister G, Pellicori S, Waluschka E, Voss K. MODIS polarization ray tracing analysis. In Shaw JA, Tyo JS, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5888. 2005. p. 1-8. 58880H https://doi.org/10.1117/12.617635
Souaidia, N. ; Moyer, D. ; Meister, G. ; Pellicori, S. ; Waluschka, E. ; Voss, Kenneth. / MODIS polarization ray tracing analysis. Proceedings of SPIE - The International Society for Optical Engineering. editor / J.A. Shaw ; J.S. Tyo. Vol. 5888 2005. pp. 1-8
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