Model-fitting approach to cluster validation with application to stochastic model-based image segmentation

J. W. Modestino, J. Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

An unsupervised stochastic model-based image segmentation technique requires the model parameters for the various image classes in an observed image to be estimated directly from the image. In this work, a clustering scheme is used for the model parameter estimation. Most of the existing clustering procedures require prior knowledge of the number of classes which is often, as in unsupervised image segmentation, unavailable and has to be estimated. The problem of determining the number of classes directly from observed data is known as the cluster validation problem. For unsupervised image segmentation, the solution of this problem directly affects the quality of the segmentation. In this work, we propose a model-fitting approach to the cluster validation problem based upon Akaike's Information Criterion (AIC). The explicit evaluation of the AIC is achieved through an approxmate maximum-likelihood (ML) estimation algorithm. We demonstrate the efficacy and robustness of the proposed approach through experimental results for both synthetic mixture data and image data.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsWilliam A. Pearlman
Place of PublicationBellingham, WA, United States
PublisherPubl by Int Soc for Optical Engineering
Pages1381-1392
Number of pages12
Volume1199
Editionpt 3
ISBN (Print)0819402389
StatePublished - Dec 1 1989
EventVisual Communications and Image Processing IV - Philadelphia, PA, USA
Duration: Nov 8 1989Nov 10 1989

Other

OtherVisual Communications and Image Processing IV
CityPhiladelphia, PA, USA
Period11/8/8911/10/89

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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    Modestino, J. W., & Zhang, J. (1989). Model-fitting approach to cluster validation with application to stochastic model-based image segmentation. In W. A. Pearlman (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (pt 3 ed., Vol. 1199, pp. 1381-1392). Publ by Int Soc for Optical Engineering.