MFM quantification of magnetic fields generated by ultra-small single pole perpendicular heads

S. K. Khizroev, W. Jayasekara, J. A. Bain, R. E. Jones, M. H. Kryder

Research output: Contribution to journalConference articlepeer-review

25 Scopus citations

Abstract

The perpendicular fields emanating from an ultra small perpendicular single pole head have been quantified using a new MFM field mapping technique. This technique utilizes two MFM tips with different field sensitivities which have been focused ion beam etched to identical geometries. This technique has been used to quantify the perpendicular fields around a 100×200 nm pole, also fabricated with focused ion beam etching.

Original languageEnglish (US)
Pages (from-to)2030-2032
Number of pages3
JournalIEEE Transactions on Magnetics
Volume34
Issue number4 pt 1
DOIs
StatePublished - Jul 1998
Externally publishedYes
EventProceedings of the 1998 7th Joint Magnetism and Magnetic Materials - International Magnetics Conference. Part 1 (of 2) - San Francisco, CA, USA
Duration: Jan 6 1998Jan 9 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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