Mechanical characterization of nickel nanowires by using a customized atomic force microscope

Emrah Celik, Ibrahim Guven, Erdogan Madenci

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

A new experimental method to characterize the mechanical properties of metallic nanowires is introduced. An accurate and fast mechanical characterization of nanowires requires simultaneous imaging and testing of the nanowires. However, existing mechanical characterization techniques fail to accomplish this goal due either to the lack of imaging capability of the mechanical test setup or the difficulty of individual alignment and manipulation of single nanowires for each test. In this study, nanowire specimens prepared by an electroplating technique are located on a silicon substrate with trenches. A customized atomic force microscope is located inside a scanning electron microscope (SEM) in order to establish the visibility of the nanowires, and the tip of the atomic force microscope cantilever is utilized to bend and break the nanowires. The ability to visualize the nanowires in an SEM improves the speed and accuracy of the tests. Experimentally obtained force versus bending displacement curves are fitted into existing analytical formulations to extract the mechanical properties. Experimental results reveal that nickel nanowires have significantly higher strengths than their bulk counterparts, although their elastic modulus values are comparable to bulk nickel modulus values.

Original languageEnglish (US)
Article number155702
JournalNanotechnology
Volume22
Issue number15
DOIs
StatePublished - Apr 15 2011
Externally publishedYes

Fingerprint

Nickel
Nanowires
Microscopes
Electron microscopes
Scanning
Imaging techniques
Mechanical properties
Electroplating
Silicon
Visibility
Elastic moduli
Testing
Substrates

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Electrical and Electronic Engineering
  • Mechanical Engineering
  • Mechanics of Materials
  • Materials Science(all)

Cite this

Mechanical characterization of nickel nanowires by using a customized atomic force microscope. / Celik, Emrah; Guven, Ibrahim; Madenci, Erdogan.

In: Nanotechnology, Vol. 22, No. 15, 155702, 15.04.2011.

Research output: Contribution to journalArticle

@article{398318f25cc2459b9bc750846e95ede9,
title = "Mechanical characterization of nickel nanowires by using a customized atomic force microscope",
abstract = "A new experimental method to characterize the mechanical properties of metallic nanowires is introduced. An accurate and fast mechanical characterization of nanowires requires simultaneous imaging and testing of the nanowires. However, existing mechanical characterization techniques fail to accomplish this goal due either to the lack of imaging capability of the mechanical test setup or the difficulty of individual alignment and manipulation of single nanowires for each test. In this study, nanowire specimens prepared by an electroplating technique are located on a silicon substrate with trenches. A customized atomic force microscope is located inside a scanning electron microscope (SEM) in order to establish the visibility of the nanowires, and the tip of the atomic force microscope cantilever is utilized to bend and break the nanowires. The ability to visualize the nanowires in an SEM improves the speed and accuracy of the tests. Experimentally obtained force versus bending displacement curves are fitted into existing analytical formulations to extract the mechanical properties. Experimental results reveal that nickel nanowires have significantly higher strengths than their bulk counterparts, although their elastic modulus values are comparable to bulk nickel modulus values.",
author = "Emrah Celik and Ibrahim Guven and Erdogan Madenci",
year = "2011",
month = "4",
day = "15",
doi = "10.1088/0957-4484/22/15/155702",
language = "English (US)",
volume = "22",
journal = "Nanotechnology",
issn = "0957-4484",
publisher = "IOP Publishing Ltd.",
number = "15",

}

TY - JOUR

T1 - Mechanical characterization of nickel nanowires by using a customized atomic force microscope

AU - Celik, Emrah

AU - Guven, Ibrahim

AU - Madenci, Erdogan

PY - 2011/4/15

Y1 - 2011/4/15

N2 - A new experimental method to characterize the mechanical properties of metallic nanowires is introduced. An accurate and fast mechanical characterization of nanowires requires simultaneous imaging and testing of the nanowires. However, existing mechanical characterization techniques fail to accomplish this goal due either to the lack of imaging capability of the mechanical test setup or the difficulty of individual alignment and manipulation of single nanowires for each test. In this study, nanowire specimens prepared by an electroplating technique are located on a silicon substrate with trenches. A customized atomic force microscope is located inside a scanning electron microscope (SEM) in order to establish the visibility of the nanowires, and the tip of the atomic force microscope cantilever is utilized to bend and break the nanowires. The ability to visualize the nanowires in an SEM improves the speed and accuracy of the tests. Experimentally obtained force versus bending displacement curves are fitted into existing analytical formulations to extract the mechanical properties. Experimental results reveal that nickel nanowires have significantly higher strengths than their bulk counterparts, although their elastic modulus values are comparable to bulk nickel modulus values.

AB - A new experimental method to characterize the mechanical properties of metallic nanowires is introduced. An accurate and fast mechanical characterization of nanowires requires simultaneous imaging and testing of the nanowires. However, existing mechanical characterization techniques fail to accomplish this goal due either to the lack of imaging capability of the mechanical test setup or the difficulty of individual alignment and manipulation of single nanowires for each test. In this study, nanowire specimens prepared by an electroplating technique are located on a silicon substrate with trenches. A customized atomic force microscope is located inside a scanning electron microscope (SEM) in order to establish the visibility of the nanowires, and the tip of the atomic force microscope cantilever is utilized to bend and break the nanowires. The ability to visualize the nanowires in an SEM improves the speed and accuracy of the tests. Experimentally obtained force versus bending displacement curves are fitted into existing analytical formulations to extract the mechanical properties. Experimental results reveal that nickel nanowires have significantly higher strengths than their bulk counterparts, although their elastic modulus values are comparable to bulk nickel modulus values.

UR - http://www.scopus.com/inward/record.url?scp=79952691538&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79952691538&partnerID=8YFLogxK

U2 - 10.1088/0957-4484/22/15/155702

DO - 10.1088/0957-4484/22/15/155702

M3 - Article

C2 - 21389567

AN - SCOPUS:79952691538

VL - 22

JO - Nanotechnology

JF - Nanotechnology

SN - 0957-4484

IS - 15

M1 - 155702

ER -