Mechanical characterization of nanowires using a customized atomic force microscope

Emrah Celik, Ibrahim Guven, Erdogan Madenci

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

A new experimental method is introduced in order to characterize the mechanical properties of metallic nanowires. An accurate mechanical characterization of nanowires requires the imaging with scanning electron microscope (SEM) and the bending of nanowires with an atomic force microscope (AFM). In this study, an AFM is located inside an SEM in order to establish the visibility of the nanowires. The tip of the AFM cantilever is utilized to bend and break the nanowires. Nanowire specimens are prepared by electroplating of metal ions into the nanoscale pores of the alumina membranes. The mechanical properties are extracted by using existing analytical formulation along with the experimental force versus bending displacement response. Preliminary results revealed that copper nanowires have unique mechanical properties such as high flexibility in addition to high strength compared to their bulk counterparts.

Original languageEnglish (US)
Title of host publicationConference Proceedings of the Society for Experimental Mechanics Series
Pages117-126
Number of pages10
Volume6
StatePublished - 2011
Externally publishedYes
Event2010 Annual Conference on Experimental and Applied Mechanics - Indianapolis, IN, United States
Duration: Jun 7 2010Jun 10 2010

Other

Other2010 Annual Conference on Experimental and Applied Mechanics
CountryUnited States
CityIndianapolis, IN
Period6/7/106/10/10

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ASJC Scopus subject areas

  • Engineering(all)
  • Computational Mechanics
  • Mechanical Engineering

Cite this

Celik, E., Guven, I., & Madenci, E. (2011). Mechanical characterization of nanowires using a customized atomic force microscope. In Conference Proceedings of the Society for Experimental Mechanics Series (Vol. 6, pp. 117-126)