Magnetic force microscopy study of the thermal stability of perpendicular magnetic recording media

Erik B. Svedberg, Dmitri Litvinov, Sakhrat Khizroev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Perpendicular recording is believed to be one of the most promising candidates for the future generations of hard drives, because perpendicular recording is technically close to conventional longitudinal recording while it addresses the critical issue of thermal stability. A magnetic force microscopy (MFM) study of the data stability in a double-layer perpendicular magnetic recording medium is presented. Autocorrelation signal-to-noise ratio (ACSN) and more conventional signal-to-noise ratio (SNR) analysis were used in conjunction with MFM to characterize the integral noise characteristics of the written tracks. Transition noise, DC noise, and percolation effects were also studied to provide more detailed information on various sources of noise. Two types of media were investigated: CoCr-alloy based with relatively low remanent squareness of 0.7 and coercivity of 3.5 kOe and a Co/Pd based multilayer with remanent squareness of 1, coercivity field of 7 kOe and nucleation field of 3 kOe.

Original languageEnglish (US)
Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
EditorsJ. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0780373650, 9780780373655
DOIs
StatePublished - 2002
Externally publishedYes
Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
Duration: Apr 28 2002May 2 2002

Publication series

NameINTERMAG Europe 2002 - IEEE International Magnetics Conference

Conference

Conference2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
Country/TerritoryNetherlands
CityAmsterdam
Period4/28/025/2/02

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films

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