Inelastic electron tunneling spectrometer for complete calibrated measurements of any two or four terminal junctions

Serge Gauvin, Roger M. Leblanc

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

The conventional tunneling spectrometer gives the uncalibrated second derivative d2V/dI2 versus applied voltage (V) of the junction current-voltage curve (I-V). However, the calibrated second derivative d2I/dV2 is more useful for accurate comparison with theory and can be applied to negative resistance devices. We report here a single electronic instrument for calibrated measurements of all relevant tunneling junction parameters, i.e., dynamic conductance (G), dynamic capacitance (C), current-voltage curve, and its first and second calibrated derivatives. Moreover, it can measure the derivative of the dynamic capacitance (dC/dV) versus applied potential, which is useful for various types of semiconductor devices. This design is versatile enough to find many laboratory applications where current-voltage curves are of interest. The circuit, based on a simple design, is accurate to 1% and allows spectral acquisition in about 15 min.

Original languageEnglish (US)
Pages (from-to)149-156
Number of pages8
JournalReview of Scientific Instruments
Volume63
Issue number1
DOIs
StatePublished - Dec 1 1992
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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