TY - JOUR

T1 - Inelastic electron tunneling spectrometer for complete calibrated measurements of any two or four terminal junctions

AU - Gauvin, Serge

AU - Leblanc, Roger M.

PY - 1992

Y1 - 1992

N2 - The conventional tunneling spectrometer gives the uncalibrated second derivative d2V/dI2 versus applied voltage (V) of the junction current-voltage curve (I-V). However, the calibrated second derivative d2I/dV2 is more useful for accurate comparison with theory and can be applied to negative resistance devices. We report here a single electronic instrument for calibrated measurements of all relevant tunneling junction parameters, i.e., dynamic conductance (G), dynamic capacitance (C), current-voltage curve, and its first and second calibrated derivatives. Moreover, it can measure the derivative of the dynamic capacitance (dC/dV) versus applied potential, which is useful for various types of semiconductor devices. This design is versatile enough to find many laboratory applications where current-voltage curves are of interest. The circuit, based on a simple design, is accurate to 1% and allows spectral acquisition in about 15 min.

AB - The conventional tunneling spectrometer gives the uncalibrated second derivative d2V/dI2 versus applied voltage (V) of the junction current-voltage curve (I-V). However, the calibrated second derivative d2I/dV2 is more useful for accurate comparison with theory and can be applied to negative resistance devices. We report here a single electronic instrument for calibrated measurements of all relevant tunneling junction parameters, i.e., dynamic conductance (G), dynamic capacitance (C), current-voltage curve, and its first and second calibrated derivatives. Moreover, it can measure the derivative of the dynamic capacitance (dC/dV) versus applied potential, which is useful for various types of semiconductor devices. This design is versatile enough to find many laboratory applications where current-voltage curves are of interest. The circuit, based on a simple design, is accurate to 1% and allows spectral acquisition in about 15 min.

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U2 - 10.1063/1.1143003

DO - 10.1063/1.1143003

M3 - Article

AN - SCOPUS:0008839037

VL - 63

SP - 149

EP - 156

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 1

ER -