Imaging electrons in a single-electron quantum dot

P. Fallahi, A. C. Bleszynski, R. M. Westervelt, J. Huang, Jamie Walls, E. J. Heller, M. Hanson, A. C. Gossard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A scanning probe microscope (SPM) can be used to image a single-electron quantum dot at liquid-He temperatures by recording the Coulomb blockade conductance as a charged SPM tip is scanned above. The Coulomb blockade produces a ring in the image as the first electron is added to the dot. If the tip is sufficiently close to the surface, simulations show one may be able to extract the shape of the electron wave function inside the dot from Coulomb blockade conductance images with a resolution exceeding the size of the tip perturbation.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
Pages779-780
Number of pages2
Volume772
DOIs
StatePublished - Jun 30 2005
Externally publishedYes
EventPHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27 - Flagstaff, AZ, United States
Duration: Jul 26 2004Jul 30 2004

Other

OtherPHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27
CountryUnited States
CityFlagstaff, AZ
Period7/26/047/30/04

Fingerprint

quantum dots
microscopes
electrons
scanning
probes
recording
wave functions
perturbation
rings
liquids
simulation
temperature

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Fallahi, P., Bleszynski, A. C., Westervelt, R. M., Huang, J., Walls, J., Heller, E. J., ... Gossard, A. C. (2005). Imaging electrons in a single-electron quantum dot. In AIP Conference Proceedings (Vol. 772, pp. 779-780) https://doi.org/10.1063/1.1994338

Imaging electrons in a single-electron quantum dot. / Fallahi, P.; Bleszynski, A. C.; Westervelt, R. M.; Huang, J.; Walls, Jamie; Heller, E. J.; Hanson, M.; Gossard, A. C.

AIP Conference Proceedings. Vol. 772 2005. p. 779-780.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fallahi, P, Bleszynski, AC, Westervelt, RM, Huang, J, Walls, J, Heller, EJ, Hanson, M & Gossard, AC 2005, Imaging electrons in a single-electron quantum dot. in AIP Conference Proceedings. vol. 772, pp. 779-780, PHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27, Flagstaff, AZ, United States, 7/26/04. https://doi.org/10.1063/1.1994338
Fallahi P, Bleszynski AC, Westervelt RM, Huang J, Walls J, Heller EJ et al. Imaging electrons in a single-electron quantum dot. In AIP Conference Proceedings. Vol. 772. 2005. p. 779-780 https://doi.org/10.1063/1.1994338
Fallahi, P. ; Bleszynski, A. C. ; Westervelt, R. M. ; Huang, J. ; Walls, Jamie ; Heller, E. J. ; Hanson, M. ; Gossard, A. C. / Imaging electrons in a single-electron quantum dot. AIP Conference Proceedings. Vol. 772 2005. pp. 779-780
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