Imaging electrons in a single-electron quantum dot

P. Fallahi, A. C. Bleszynski, R. M. Westervelt, J. Huang, J. D. Walls, E. J. Heller, M. Hanson, A. C. Gossard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A scanning probe microscope (SPM) can be used to image a single-electron quantum dot at liquid-He temperatures by recording the Coulomb blockade conductance as a charged SPM tip is scanned above. The Coulomb blockade produces a ring in the image as the first electron is added to the dot. If the tip is sufficiently close to the surface, simulations show one may be able to extract the shape of the electron wave function inside the dot from Coulomb blockade conductance images with a resolution exceeding the size of the tip perturbation.

Original languageEnglish (US)
Title of host publicationPHYSICS OF SEMICONDUCTORS
Subtitle of host publication27th International Conference on the Physics of Semiconductors, ICPS-27
Pages779-780
Number of pages2
DOIs
StatePublished - Jun 30 2005
Externally publishedYes
EventPHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27 - Flagstaff, AZ, United States
Duration: Jul 26 2004Jul 30 2004

Publication series

NameAIP Conference Proceedings
Volume772
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherPHYSICS OF SEMICONDUCTORS: 27th International Conference on the Physics of Semiconductors, ICPS-27
CountryUnited States
CityFlagstaff, AZ
Period7/26/047/30/04

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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