Identification and validation of analytical chemistry methods for detecting composite surface contamination and moisture - Solid-state electrochemical sensor study

Xiangyang Zhou, Juanjuan Zhou, Zedong Wang, Dwayne McDaniel, Weihua Zhang, Richard Burton

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In-field surface contamination and moisture detection is one of the critical issues in preparation of adhesive bonds between composite adherends for aircraft manufacture. In this paper, the feasibility of an all solid-sate electrochemical sensor technology is explored. Redox pairs or mediators are combined into a solid-state electrolyte, Nafion™. The output current in response to a cyclic polarization is used as the indication of the surface contamination level. Electrochemical impedance spectroscopy measurements using the sensors made were conducted. The results indicate that the small amount of moisture and/or sulfuric acid on initially cleaned and vacuumed polymer surfaces results in about 10 times increment of the peak current in cyclic voltammetry tests.

Original languageEnglish (US)
Title of host publicationSensors, Actuators, and Microsystems (General) - 215th ECS Meeting
Pages7-17
Number of pages11
Edition22
DOIs
StatePublished - Dec 1 2009
EventSensors, Actuators, and Microsystems General Session - 215th ECS Meeting - San Francisco, CA, United States
Duration: May 24 2009May 29 2009

Publication series

NameECS Transactions
Number22
Volume19
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Other

OtherSensors, Actuators, and Microsystems General Session - 215th ECS Meeting
CountryUnited States
CitySan Francisco, CA
Period5/24/095/29/09

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Zhou, X., Zhou, J., Wang, Z., McDaniel, D., Zhang, W., & Burton, R. (2009). Identification and validation of analytical chemistry methods for detecting composite surface contamination and moisture - Solid-state electrochemical sensor study. In Sensors, Actuators, and Microsystems (General) - 215th ECS Meeting (22 ed., pp. 7-17). (ECS Transactions; Vol. 19, No. 22). https://doi.org/10.1149/1.3245165