Focused ion beam as a nanofabrication tool for rapid prototyping of nanomagnetic devices

S. Khizroev, A. Lavrenov, N. Amos, R. Chomko, D. Litvinov

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)128-129
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2006

ASJC Scopus subject areas

  • Instrumentation

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