Abstract
We report a modified procedure to fabricate electrochemically etched scanning tunneling microscopy tips under ac voltage. By both confining the etching action to a small region and controlling the etching current on a tungsten wire, we produce ultrasharp tips with low-aspect ratio. No electronic shut-off control is required. Atomic resolution images are routinely obtained.
Original language | English (US) |
---|---|
Pages (from-to) | 2695-2697 |
Number of pages | 3 |
Journal | Review of Scientific Instruments |
Volume | 66 |
Issue number | 3 |
DOIs | |
State | Published - Dec 1 1995 |
ASJC Scopus subject areas
- Instrumentation