Effects of near-tip rotation on pre-buckle crack growth of compressed beams bonded to a rigid substrate

Qingda Yang, A. A. Volinsky

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The macroscopic pre-cracked line scratch test (MPLST), in which a debonded edge of a film is loaded in in-plane compression, has been modeled as a generic, coupled fracture-buckle problem using simple beam theory. Near crack-tip beam rotation (also called root rotation in literature), which always exists due to the eccentric loading in this type of test, has been incorporated into the governing equations. An analytical solution to the augmented problem has been derived. It is found that the near-tip rotation can introduce pre-buckle bending in the film. One important consequence of this pre-buckle bending is that it leads to the reduction of the critical buckling condition. This agrees well with the results of [Int. J. Fract. 113 (2002) 39] obtained by solving the full elastic field near the crack-tip. Furthermore, the pre-buckle bending moment at crack-tip remains negative (leading to crack closure) as long as the pre-buckle crack length is small, but it becomes positive (leading to crack opening) at larger pre-buckle crack length. The negative bending moment causes the crack-tip energy release rate to decrease as the crack propagates, which results in a stable pre-buckle crack growth. Once it becomes positive, however, the bending moment causes crack-tip energy release rate to increase rapidly as crack length increases and hence leads to an unstable (pre-buckle) crack growth. Further, the nominal phase angle is initially larger than the classic prediction of 52.1° owing to the existence of the negative crack-tip bending moment, but it drops quickly upon approaching the buckle point. All these results are confirmed by a rigorous 2D FEM calculation using cohesive zone modeling (CZM) approach. Finally the derived analytical solution has been used to analyze a set of PLST data reported in the literature. It has been demonstrated that plasticity in the adhesive layer and in the bonded film is responsible for the strong R-curve toughening characteristics in the deduced interface toughness data. It has also been shown that, once the deduced interface toughness is incorporated into a CZM simulation, both the axial loading and buckling point can be accurately predicted.

Original languageEnglish
Pages (from-to)2711-2729
Number of pages19
JournalInternational Journal of Solids and Structures
Volume41
Issue number9-10
DOIs
StatePublished - May 1 2004
Externally publishedYes

Fingerprint

Crack Growth
Crack Tip
Crack tips
crack tips
Crack propagation
cracks
Substrate
bending moments
Bending moments
Crack
Cracks
Substrates
Cohesive Zone
Moment
Energy Release Rate
Toughness
Energy release rate
Buckling
toughness
buckling

Keywords

  • Buckle
  • Cohesive zone model
  • Energy release rate
  • Fracture
  • Near-tip rotation
  • Plasticity

ASJC Scopus subject areas

  • Mechanical Engineering
  • Mechanics of Materials

Cite this

Effects of near-tip rotation on pre-buckle crack growth of compressed beams bonded to a rigid substrate. / Yang, Qingda; Volinsky, A. A.

In: International Journal of Solids and Structures, Vol. 41, No. 9-10, 01.05.2004, p. 2711-2729.

Research output: Contribution to journalArticle

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abstract = "The macroscopic pre-cracked line scratch test (MPLST), in which a debonded edge of a film is loaded in in-plane compression, has been modeled as a generic, coupled fracture-buckle problem using simple beam theory. Near crack-tip beam rotation (also called root rotation in literature), which always exists due to the eccentric loading in this type of test, has been incorporated into the governing equations. An analytical solution to the augmented problem has been derived. It is found that the near-tip rotation can introduce pre-buckle bending in the film. One important consequence of this pre-buckle bending is that it leads to the reduction of the critical buckling condition. This agrees well with the results of [Int. J. Fract. 113 (2002) 39] obtained by solving the full elastic field near the crack-tip. Furthermore, the pre-buckle bending moment at crack-tip remains negative (leading to crack closure) as long as the pre-buckle crack length is small, but it becomes positive (leading to crack opening) at larger pre-buckle crack length. The negative bending moment causes the crack-tip energy release rate to decrease as the crack propagates, which results in a stable pre-buckle crack growth. Once it becomes positive, however, the bending moment causes crack-tip energy release rate to increase rapidly as crack length increases and hence leads to an unstable (pre-buckle) crack growth. Further, the nominal phase angle is initially larger than the classic prediction of 52.1° owing to the existence of the negative crack-tip bending moment, but it drops quickly upon approaching the buckle point. All these results are confirmed by a rigorous 2D FEM calculation using cohesive zone modeling (CZM) approach. Finally the derived analytical solution has been used to analyze a set of PLST data reported in the literature. It has been demonstrated that plasticity in the adhesive layer and in the bonded film is responsible for the strong R-curve toughening characteristics in the deduced interface toughness data. It has also been shown that, once the deduced interface toughness is incorporated into a CZM simulation, both the axial loading and buckling point can be accurately predicted.",
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N2 - The macroscopic pre-cracked line scratch test (MPLST), in which a debonded edge of a film is loaded in in-plane compression, has been modeled as a generic, coupled fracture-buckle problem using simple beam theory. Near crack-tip beam rotation (also called root rotation in literature), which always exists due to the eccentric loading in this type of test, has been incorporated into the governing equations. An analytical solution to the augmented problem has been derived. It is found that the near-tip rotation can introduce pre-buckle bending in the film. One important consequence of this pre-buckle bending is that it leads to the reduction of the critical buckling condition. This agrees well with the results of [Int. J. Fract. 113 (2002) 39] obtained by solving the full elastic field near the crack-tip. Furthermore, the pre-buckle bending moment at crack-tip remains negative (leading to crack closure) as long as the pre-buckle crack length is small, but it becomes positive (leading to crack opening) at larger pre-buckle crack length. The negative bending moment causes the crack-tip energy release rate to decrease as the crack propagates, which results in a stable pre-buckle crack growth. Once it becomes positive, however, the bending moment causes crack-tip energy release rate to increase rapidly as crack length increases and hence leads to an unstable (pre-buckle) crack growth. Further, the nominal phase angle is initially larger than the classic prediction of 52.1° owing to the existence of the negative crack-tip bending moment, but it drops quickly upon approaching the buckle point. All these results are confirmed by a rigorous 2D FEM calculation using cohesive zone modeling (CZM) approach. Finally the derived analytical solution has been used to analyze a set of PLST data reported in the literature. It has been demonstrated that plasticity in the adhesive layer and in the bonded film is responsible for the strong R-curve toughening characteristics in the deduced interface toughness data. It has also been shown that, once the deduced interface toughness is incorporated into a CZM simulation, both the axial loading and buckling point can be accurately predicted.

AB - The macroscopic pre-cracked line scratch test (MPLST), in which a debonded edge of a film is loaded in in-plane compression, has been modeled as a generic, coupled fracture-buckle problem using simple beam theory. Near crack-tip beam rotation (also called root rotation in literature), which always exists due to the eccentric loading in this type of test, has been incorporated into the governing equations. An analytical solution to the augmented problem has been derived. It is found that the near-tip rotation can introduce pre-buckle bending in the film. One important consequence of this pre-buckle bending is that it leads to the reduction of the critical buckling condition. This agrees well with the results of [Int. J. Fract. 113 (2002) 39] obtained by solving the full elastic field near the crack-tip. Furthermore, the pre-buckle bending moment at crack-tip remains negative (leading to crack closure) as long as the pre-buckle crack length is small, but it becomes positive (leading to crack opening) at larger pre-buckle crack length. The negative bending moment causes the crack-tip energy release rate to decrease as the crack propagates, which results in a stable pre-buckle crack growth. Once it becomes positive, however, the bending moment causes crack-tip energy release rate to increase rapidly as crack length increases and hence leads to an unstable (pre-buckle) crack growth. Further, the nominal phase angle is initially larger than the classic prediction of 52.1° owing to the existence of the negative crack-tip bending moment, but it drops quickly upon approaching the buckle point. All these results are confirmed by a rigorous 2D FEM calculation using cohesive zone modeling (CZM) approach. Finally the derived analytical solution has been used to analyze a set of PLST data reported in the literature. It has been demonstrated that plasticity in the adhesive layer and in the bonded film is responsible for the strong R-curve toughening characteristics in the deduced interface toughness data. It has also been shown that, once the deduced interface toughness is incorporated into a CZM simulation, both the axial loading and buckling point can be accurately predicted.

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KW - Plasticity

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