In this letter, a direct measurement of "easy" magnetization switching indicating zero-magnetization remanence in a magnetic probe with a cross section as narrow as 60×60nm2, and as tall as 750 nm, is presented. Magnetic force microscopy was utilized to test focused-ion-beam- fabricated nanomagnetic probes. The data directly indicate that unlike a regular solid probe, a probe with a tubelike ending (nanotube) provides substantially "easier" switching.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)