Direct observation of magnetization switching in focused-ion-beam- fabricated magnetic nanotubes

Sakhrat Khizroev, Mark H. Kryder, Dmitri Litvinov, David A. Thompson

Research output: Contribution to journalArticlepeer-review

58 Scopus citations

Abstract

In this letter, a direct measurement of "easy" magnetization switching indicating zero-magnetization remanence in a magnetic probe with a cross section as narrow as 60×60nm2, and as tall as 750 nm, is presented. Magnetic force microscopy was utilized to test focused-ion-beam- fabricated nanomagnetic probes. The data directly indicate that unlike a regular solid probe, a probe with a tubelike ending (nanotube) provides substantially "easier" switching.

Original languageEnglish (US)
Pages (from-to)2256-2257
Number of pages2
JournalApplied Physics Letters
Volume81
Issue number12
DOIs
StatePublished - Sep 16 2002
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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