Characterization of metallic nanowires by combining atomic force microscope (AFM) and scanning electron microscope (SEM)

E. Celik, E. Madenci

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

A new experimental method is introduced in order to characterize the mechanical properties of metallic nanowires. An accurate mechanical characterization of nanowires requires simultaneous imaging using scanning electron microscope (SEM) and mechanical testing with an atomic force microscope (AFM). In this study, an AFM is located inside an SEM chamber in order to establish the visibility of the nanowires. The tip of the AFM cantilever is utilized to bend and break the nanowires. Nanowire specimens are prepared by electroplating of metal ions into the nano-pores of the alumina membranes. Mechanical properties are extracted by using existing analytical formulations along with the experimental force versus bending displacement response. Preliminary results revealed that copper nanowires have unique mechanical properties compared to their bulk counterparts.

Original languageEnglish (US)
Title of host publicationNanotechnology 2010
Subtitle of host publicationAdvanced Materials, CNTs, Particles, Films and Composites - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010
Pages13-16
Number of pages4
StatePublished - Nov 9 2010
Externally publishedYes
EventNanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites - 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010 - Anaheim, CA, United States
Duration: Jun 21 2010Jun 24 2010

Publication series

NameNanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010
Volume1

Other

OtherNanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites - 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010
CountryUnited States
CityAnaheim, CA
Period6/21/106/24/10

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Keywords

  • Atomic force microscope
  • Nanomechanics
  • Nanowire
  • Scanning electron microscope

ASJC Scopus subject areas

  • Ceramics and Composites
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

Cite this

Celik, E., & Madenci, E. (2010). Characterization of metallic nanowires by combining atomic force microscope (AFM) and scanning electron microscope (SEM). In Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010 (pp. 13-16). (Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010; Vol. 1).