A low diffusion E-CUSP (LDE) scheme is applied with 5th order WENO scheme in this paper. The E-CUSP scheme can capture crisp shock profile and exact contact surface. Several numerical cases are presented to demonstrate the accuracy and robustness for the E-CUSP scheme to be used with the WENO strategy.
|Original language||English (US)|
|Title of host publication||46th AIAA Aerospace Sciences Meeting and Exhibit|
|Publisher||American Institute of Aeronautics and Astronautics Inc.|
|State||Published - 2008|
|Name||46th AIAA Aerospace Sciences Meeting and Exhibit|
ASJC Scopus subject areas
- Aerospace Engineering