Buckling of a stiff thin film on a compliant substrate in large deformation

J. Song, H. Jiang, Z. J. Liu, D. Y. Khang, Y. Huang, J. A. Rogers, C. Lu, C. G. Koh

Research output: Contribution to journalArticle

172 Scopus citations

Abstract

A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically.

Original languageEnglish (US)
Pages (from-to)3107-3121
Number of pages15
JournalInternational Journal of Solids and Structures
Volume45
Issue number10
DOIs
StatePublished - May 15 2008

Keywords

  • Buckling
  • Finite deformation
  • Finite element analysis
  • Perturbation analysis
  • Thin film

ASJC Scopus subject areas

  • Mechanical Engineering
  • Mechanics of Materials

Fingerprint Dive into the research topics of 'Buckling of a stiff thin film on a compliant substrate in large deformation'. Together they form a unique fingerprint.

  • Cite this

    Song, J., Jiang, H., Liu, Z. J., Khang, D. Y., Huang, Y., Rogers, J. A., Lu, C., & Koh, C. G. (2008). Buckling of a stiff thin film on a compliant substrate in large deformation. International Journal of Solids and Structures, 45(10), 3107-3121. https://doi.org/10.1016/j.ijsolstr.2008.01.023