Abstract
The University of Miami has developed an automatic, unattended profiler system called the Cyclesonde. This system measures, records and reports data via radio. Sample data records from shallow water and the surface layers of the deep sea are also described. With record lengths of as much as one month, this technique becomes a viable alternative to costly ship anchor stations and dense vertical arrays of moored fixed-level instruments.
| Original language | English (US) |
|---|---|
| Journal | Instrumentation in the Aerospace Industry : Proceedings of the International Symposium |
| Volume | 22 |
| State | Published - Jan 1 1976 |
| Externally published | Yes |
| Event | Proc of Int Instrum Symp, 22nd - San Diego, CA, USA Duration: May 25 1976 → May 27 1976 |
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ASJC Scopus subject areas
- Engineering(all)
Cite this
AUTOMATIC OCEANOGRAPHIC PROFILING INSTRUMENT. / Van Leer, John.
In: Instrumentation in the Aerospace Industry : Proceedings of the International Symposium, Vol. 22, 01.01.1976.Research output: Contribution to journal › Conference article
}
TY - JOUR
T1 - AUTOMATIC OCEANOGRAPHIC PROFILING INSTRUMENT.
AU - Van Leer, John
PY - 1976/1/1
Y1 - 1976/1/1
N2 - The University of Miami has developed an automatic, unattended profiler system called the Cyclesonde. This system measures, records and reports data via radio. Sample data records from shallow water and the surface layers of the deep sea are also described. With record lengths of as much as one month, this technique becomes a viable alternative to costly ship anchor stations and dense vertical arrays of moored fixed-level instruments.
AB - The University of Miami has developed an automatic, unattended profiler system called the Cyclesonde. This system measures, records and reports data via radio. Sample data records from shallow water and the surface layers of the deep sea are also described. With record lengths of as much as one month, this technique becomes a viable alternative to costly ship anchor stations and dense vertical arrays of moored fixed-level instruments.
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UR - http://www.scopus.com/inward/citedby.url?scp=0017215653&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0017215653
VL - 22
JO - Instrumentation in the Aerospace Industry : Proceedings of the International Symposium
JF - Instrumentation in the Aerospace Industry : Proceedings of the International Symposium
SN - 0227-7576
ER -