Abstract
We report voltage noise studies in the superconducting transition of thin Tin (Sn) films. Voltage noises are measured as a function of temperature and ac current. The noise spectral power S 1/2 strongly depends on the temperature and current, with the peak temperature in S 1/2 shifted down from that of dR/dT. Comparison with the dc noise measurement shows the S 1/2 is much larger with ac current than dc. I-V characteristics and voltage noises are measured simultaneously to reveal the nature of the excess noises. The noise dependence on voltage strongly suggests the nature of vortex shot noise with a characteristic √V dependence for small V and reduction of S 1/2 due to strong correlation of vortices at large V.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 206-210 |
| Number of pages | 5 |
| Journal | Journal of Low Temperature Physics |
| Volume | 151 |
| Issue number | 1-2 PART 1 |
| DOIs | |
| State | Published - Apr 2008 |
Fingerprint
Keywords
- Superconducting transition
- Voltage noises
- Vortex motion
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
Cite this
Anomalous voltage noise at the superconducting transition of tin films. / Zhang, Hengsong; Zuo, Fulin; Galeazzi, Massimiliano.
In: Journal of Low Temperature Physics, Vol. 151, No. 1-2 PART 1, 04.2008, p. 206-210.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Anomalous voltage noise at the superconducting transition of tin films
AU - Zhang, Hengsong
AU - Zuo, Fulin
AU - Galeazzi, Massimiliano
PY - 2008/4
Y1 - 2008/4
N2 - We report voltage noise studies in the superconducting transition of thin Tin (Sn) films. Voltage noises are measured as a function of temperature and ac current. The noise spectral power S 1/2 strongly depends on the temperature and current, with the peak temperature in S 1/2 shifted down from that of dR/dT. Comparison with the dc noise measurement shows the S 1/2 is much larger with ac current than dc. I-V characteristics and voltage noises are measured simultaneously to reveal the nature of the excess noises. The noise dependence on voltage strongly suggests the nature of vortex shot noise with a characteristic √V dependence for small V and reduction of S 1/2 due to strong correlation of vortices at large V.
AB - We report voltage noise studies in the superconducting transition of thin Tin (Sn) films. Voltage noises are measured as a function of temperature and ac current. The noise spectral power S 1/2 strongly depends on the temperature and current, with the peak temperature in S 1/2 shifted down from that of dR/dT. Comparison with the dc noise measurement shows the S 1/2 is much larger with ac current than dc. I-V characteristics and voltage noises are measured simultaneously to reveal the nature of the excess noises. The noise dependence on voltage strongly suggests the nature of vortex shot noise with a characteristic √V dependence for small V and reduction of S 1/2 due to strong correlation of vortices at large V.
KW - Superconducting transition
KW - Voltage noises
KW - Vortex motion
UR - http://www.scopus.com/inward/record.url?scp=40649127425&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=40649127425&partnerID=8YFLogxK
U2 - 10.1007/s10909-007-9644-y
DO - 10.1007/s10909-007-9644-y
M3 - Article
VL - 151
SP - 206
EP - 210
JO - Journal of Low Temperature Physics
JF - Journal of Low Temperature Physics
SN - 0022-2291
IS - 1-2 PART 1
ER -