An intrinsic assessment and comparison of biometric systems through wavelet analysis

James P. Burnes, James M. Tien, Woojin Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Most, if not all, assessments or comparisons of biometric systems focus on extrinsic characteristics; our focus is intrinsic, as we are concerned with the biometric signals and images that underpin each system, and not with how these signals are obtained, matched or interpreted. Through the intrinsic assessment of a biometric system, we expect to answer several policy-related questions, including: How robust is the system? How can the system be refined? To what extent is the system intrinsically prone to error? Likewise, through the intrinsic comparison of two or more biometric systems, we expect to answer questions concerning: To what extent are the systems complementary? Can a more robust, hybrid system be identified? As with any assessment or comparative analysis of a number of systems, it is necessary to carry out the analysis within a consistent framework or model. After considering a number of approaches, we employ the wavelet transform technique because of its robustness in modeling most, if not all, of the biometric signals and images and its ability to shed light on the above policy-related questions.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE International Conference on Systems, Man and Cybernetics
Pages4514-4521
Number of pages8
Volume5
StatePublished - 2003
Externally publishedYes
EventSystem Security and Assurance - Washington, DC, United States
Duration: Oct 5 2003Oct 8 2003

Other

OtherSystem Security and Assurance
CountryUnited States
CityWashington, DC
Period10/5/0310/8/03

Fingerprint

Wavelet analysis
Biometrics
Hybrid systems
Wavelet transforms

Keywords

  • Biometric systems
  • System assessment
  • Wavelet analysis

ASJC Scopus subject areas

  • Hardware and Architecture
  • Control and Systems Engineering

Cite this

Burnes, J. P., Tien, J. M., & Chang, W. (2003). An intrinsic assessment and comparison of biometric systems through wavelet analysis. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics (Vol. 5, pp. 4514-4521)

An intrinsic assessment and comparison of biometric systems through wavelet analysis. / Burnes, James P.; Tien, James M.; Chang, Woojin.

Proceedings of the IEEE International Conference on Systems, Man and Cybernetics. Vol. 5 2003. p. 4514-4521.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Burnes, JP, Tien, JM & Chang, W 2003, An intrinsic assessment and comparison of biometric systems through wavelet analysis. in Proceedings of the IEEE International Conference on Systems, Man and Cybernetics. vol. 5, pp. 4514-4521, System Security and Assurance, Washington, DC, United States, 10/5/03.
Burnes JP, Tien JM, Chang W. An intrinsic assessment and comparison of biometric systems through wavelet analysis. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics. Vol. 5. 2003. p. 4514-4521
Burnes, James P. ; Tien, James M. ; Chang, Woojin. / An intrinsic assessment and comparison of biometric systems through wavelet analysis. Proceedings of the IEEE International Conference on Systems, Man and Cybernetics. Vol. 5 2003. pp. 4514-4521
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