1/f noise and hot electron effects in variable range hopping conduction

D. McCammon, M. Galeazzi, D. Liu, W. T. Sanders, B. Smith, P. Tan, K. R. Boyce, R. Brekosky, J. D. Gygax, R. Kelley, D. B. Mott, F. S. Porter, C. K. Stahle, C. M. Stahle, A. E. Szymkowiak

Research output: Contribution to journalArticlepeer-review

32 Scopus citations

Fingerprint

Dive into the research topics of '1/f noise and hot electron effects in variable range hopping conduction'. Together they form a unique fingerprint.

Physics & Astronomy

Chemical Compounds

Engineering & Materials Science